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Synchrotron Radiation Study of Gain, Noise, and Collection Efficiency of GaAs SAM-APDs with Staircase Structure 1-gen-2022 Colja, Matija; Cautero, Marco; Menk, Ralf Hendrik; Palestri, Pierpaolo; Gianoncelli, Alessandra; Antonelli, Matias; Biasiol, Giorgio; Dal Zilio, Simone; Steinhartova, Tereza; Nichetti, Camilla; Arfelli, Fulvia; De Angelis, Dario; Driussi, Francesco; Bonanni, Valentina; Pilotto, Alessandro; Gariani, Gianluca; Carrato, Sergio; Cautero, Giuseppe
Polarization switching and AC small-signal capacitance in Ferroelectric Tunnel Junctions 1-gen-2022 Segatto, M.; Massarotto, M.; Lancaster, S.; Duong, Q. T.; Affanni, A.; Fontanini, R.; Driussi, F.; Lizzit, D.; Mikolajick, T.; Slesazeck, S.; Esseni, D.
Versatile experimental setup for FTJ characterization 1-gen-2022 Massarotto, M.; Driussi, F.; Affanni, A.; Lancaster, S.; Slesazeck, S.; Mikolajick, T.; Esseni, D.
Modeling Approaches for Gain, Noise and Time Response of Avalanche Photodiodes for X-Rays Detection 1-gen-2022 Pilotto, A.; Antonelli, M.; Arfelli, F.; Biasiol, G.; Cautero, G.; Cautero, M.; Colja, M.; Driussi, F.; Esseni, D.; Menk, R. H.; Nichetti, C.; Rosset, F.; Selmi, L.; Steinhartova, T.; Palestri, P.
Study of gain, noise, and collection efficiency of GaAs SAM-APDs single pixel 1-gen-2022 Colja, M.; Cautero, M.; Menk, R. H.; Palestri, P.; Gianoncelli, A.; Antonelli, M.; Biasiol, G.; Zilio, S. D.; Steinhartova, T.; Nichetti, C.; Arfelli, F.; De Angelis, D.; Driussi, F.; Bonanni, V.; Pilotto, A.; Gariani, G.; Carrato, S.; Cautero, G.
Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures 1-gen-2022 Segatto, M.; Fontanini, R.; Driussi, F.; Lizzit, D.; Esseni, D.
Charge-Trapping-Induced Compensation of the Ferroelectric Polarization in FTJs: Optimal Conditions for a Synaptic Device Operation 1-gen-2022 Fontanini, R.; Segatto, M.; Nair, K. S.; Holzer, M.; Driussi, F.; Hausler, I.; Koch, C. T.; Dubourdieu, C.; Deshpande, V.; Esseni, D.
Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon 1-gen-2022 Driussi, F.; Esseni, D.; Lizzit, D.; Palestri, P.
Engineering of metal-MoS2 contacts to overcome Fermi level pinning 1-gen-2022 Khakbaz, P.; Driussi, F.; Giannozzi, P.; Gambi, A.; Lizzit, D.; Esseni, D.
A study of metal-MoS2 contacts by using an in-house developed ab-initio transport simulator 1-gen-2022 Lizzit, Daniel; Khakbaz, Pedram; Driussi, Francesco; Pala, Marco; Esseni, David
Ab-initio transport simulations unveil the Schottky versus Tunneling barrier trade-off in metal-TMD contacts 1-gen-2022 Lizzit, D.; Khakbaz, P.; Driussi, F.; Pala, M.; Esseni, D.
Reducing the tunneling barrier thickness of bilayer ferroelectric tunnel junctions with metallic electrodes 1-gen-2023 Lancaster, Suzanne; Segatto, Mattia; Silva, Cláudia; Max, Benjamin; Mikolajick, Thomas; Esseni, David; Driussi, Francesco; Slesazeck, Stefan
Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions 1-gen-2023 Massarotto, M.; Driussi, F.; Affanni, A.; Lancaster, S.; Slesazeck, S.; Mikolajick, T.; Esseni, D.
Bridging Large-Signal and Small-Signal Responses of Hafnium-Based Ferroelectric Tunnel Junctions 1-gen-2023 Massarotto, M.; Segatto, M.; Driussi, F.; Affanni, A.; Lancaster, S.; Slesazeck, S.; Mikolajick, T.; Esseni, D.
Experimental Characterization of Separate Absorption–Multiplication GaAs Staircase Avalanche Photodiodes under Continuous Laser Light Reveals Periodic Oscillations at High Gains 1-gen-2023 Colja, Matija; Cautero, Marco; Arfelli, Fulvia; Bertolo, Michele; Biasiol, Giorgio; Dal Zilio, Simone; Driussi, Francesco; Menk, Ralf Hendrik; Modesti, Silvio; Palestri, Pierpaolo; Pilotto, Alessandro; Cautero, Giuseppe
Ohmic Behavior in Metal Contacts to n/p-Type Transition-Metal Dichalcogenides: Schottky versus Tunneling Barrier Trade-off 1-gen-2023 Lizzit, D.; Khakbaz, P.; Driussi, F.; Pala, M.; Esseni, D.
Editorial: Selected papers from the 8th Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2022) 1-gen-2023 Driussi, F.; Esseni, D.; Lizzit, D.; Palestri, P.
Modelling and Simulations of Ferroelectric Materials and Ferroelectric-Based Nanoelectronic Devices : (Invited Paper) 1-gen-2023 Esseni, D.; Driussi, F.; Lizzit, D.; Massarotto, M.; Segatto, M.
Time-Resolved 3D Imaging with Capacitively Coupled GaAs SAM-APD and Cross-Delay Lines for Hard X-Ray Photon Detection 1-gen-2024 Lusardi, N.; Antonelli, M.; Arfelli, F.; Biasiol, G.; Bonanno, G.; Brajnik, G.; Carrato, S.; Cautero, M.; Cautero, G.; Costa, A.; Curcio, D.; Zilio, S. Dal; Driussi, F.; Garzetti, F.; Geraci, A.; Harutyunyan, V.; Menk, R.; Palestri, P.; Pilotto, A.; Ronconi, E.; Sbuelz, L.; Sergo, R.; Stebel, L.
Compact expression to model the effects of dielectric absorption on analog-to-digital converters 1-gen-2024 Saro, Simone; Palestri, Pierpaolo; Caruso, Enrico; Toniutti, Paolo; Calabro, Rocco; Terokhin, Semen; Driussi, Francesco
Analysis and Compensation of the Series Resistance Effects on the Characteristics of Ferroelectric Capacitors 1-gen-2024 Massarotto, Marco; Driussi, Francesco; Bucovaz, Mattia; Affanni, Antonio; Lancaster, Suzanne; Slesazeck, Stefan; Mikolajick, Thomas; Esseni, David
Reinterpreting Low Resistance in Sb–MoS2 Ohmic Contacts by Means of Ab Initio Transport Simulations 1-gen-2024 Lizzit, Daniel; Pala, Marco; Driussi, Francesco; Esseni, David
Mostrati risultati da 101 a 122 di 122
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