In this paper, we investigate electron transport and electron scattering in the insulators of the Graphene Base Transistor (GBT) by means of a Monte Carlo transport model. We focus on electron backscattering in the base-collector insulator as the possible root cause of the large experimental base current and small measured common-base current gain (αF) of GBTs. Different GBT structures have been simulated and the impact of the scattering parameters on the base current is analyzed. Simulated backscattering-limited αF values are found to be much higher than available experimental data, suggesting that state-of-the-art technology is still far from being optimized. However, those simulated αF values can be low enough to limit the maximum achievable GBT performance.

Backscattering and common-base current gain of the Graphene Base Transistor (GBT)

VENICA, Stefano;DRIUSSI, Francesco;PALESTRI, Pierpaolo;SELMI, Luca
2015-01-01

Abstract

In this paper, we investigate electron transport and electron scattering in the insulators of the Graphene Base Transistor (GBT) by means of a Monte Carlo transport model. We focus on electron backscattering in the base-collector insulator as the possible root cause of the large experimental base current and small measured common-base current gain (αF) of GBTs. Different GBT structures have been simulated and the impact of the scattering parameters on the base current is analyzed. Simulated backscattering-limited αF values are found to be much higher than available experimental data, suggesting that state-of-the-art technology is still far from being optimized. However, those simulated αF values can be low enough to limit the maximum achievable GBT performance.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11390/1068425
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