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Quantum Confinement and Electronic Structure at the Surface of van der Waals Ferroelectric α-In2Se3
2023-01-01 Kremer, Geoffroy; Mahmoudi, Aymen; M'Foukh, Adel; Bouaziz, Meryem; Rahimi, Mehrdad; Della Rocca, Maria Luisa; Le Fèvre, Patrick; Dayen, Jean-Francois; Bertran, François; Matzen, Sylvia; Pala, Marco; Chaste, Julien; Oehler, Fabrice; Ouerghi, Abdelkarim
Quasi van der Waals Epitaxy of Rhombohedral-Stacked Bilayer WSe2 on GaP(111) Heterostructure
2023-01-01 Mahmoudi, Aymen; Bouaziz, Meryem; Chapuis, Niels; Kremer, Geoffroy; Chaste, Julien; Romanin, Davide; Pala, Marco; Bertran, François; Fèvre, Patrick Le; Gerber, Iann C; Patriarche, Gilles; Oehler, Fabrice; Wallart, Xavier; Ouerghi, Abdelkarim
Sensing with advanced computing technology: Fin field-effect transistors with high-k gate stack on bulk silicon
2015-01-01 Rigante, Sara; Scarbolo, Paolo; Wipf, Mathias; Stoop, Ralph L.; Bedner, Kristine; Buitrago, Elizabeth; Bazigos, Antonios; Bouvet, Didier; Calame, Michel; Schönenberger, Christian; Ionescu, Adrian M.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Quantum Confinement and Electronic Structure at the Surface of van der Waals Ferroelectric α-In2Se3 | 1-gen-2023 | Kremer, Geoffroy; Mahmoudi, Aymen; M'Foukh, Adel; Bouaziz, Meryem; Rahimi, Mehrdad; Della Rocca, Maria Luisa; Le Fèvre, Patrick; Dayen, Jean-Francois; Bertran, François; Matzen, Sylvia; Pala, Marco; Chaste, Julien; Oehler, Fabrice; Ouerghi, Abdelkarim | |
Quasi van der Waals Epitaxy of Rhombohedral-Stacked Bilayer WSe2 on GaP(111) Heterostructure | 1-gen-2023 | Mahmoudi, Aymen; Bouaziz, Meryem; Chapuis, Niels; Kremer, Geoffroy; Chaste, Julien; Romanin, Davide; Pala, Marco; Bertran, François; Fèvre, Patrick Le; Gerber, Iann C; Patriarche, Gilles; Oehler, Fabrice; Wallart, Xavier; Ouerghi, Abdelkarim | |
Sensing with advanced computing technology: Fin field-effect transistors with high-k gate stack on bulk silicon | 1-gen-2015 | Rigante, Sara; Scarbolo, Paolo; Wipf, Mathias; Stoop, Ralph L.; Bedner, Kristine; Buitrago, Elizabeth; Bazigos, Antonios; Bouvet, Didier; Calame, Michel; Schönenberger, Christian; Ionescu, Adrian M. |
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