Sfoglia per Autore
Modeling 1/f and Lorenzian noise in III-V MOSFETs
2019-01-01 Caruso, E.; Bettetti, F.; DEL LINZ, Leonida; Pin, D.; Segatto, M.; Palestri, P.
Relationship between capacitance and conductance in MOS capacitors
2019-01-01 Caruso, E.; Lin, J.; Monaghan, S.; Cherkaoui, K.; Floyd, L.; Gity, F.; Palestri, P.; Esseni, D.; Selmi, L.; Hurley, P. K.
The Role of Oxide Traps Aligned With the Semiconductor Energy Gap in {MOS} Systems
2020-01-01 Caruso, Enrico; Lin, Jun; Monaghan, Scott; Cherkaoui, Karim; Gity, Farzan; Palestri, Pierpaolo; Esseni, David; Selmi, Luca; Hurley, Paul K.
Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-of-the-Roadmap III–V MOSFETs
2020-01-01 Zagni, Nicolo; Caruso, Enrico; Puglisi, Francesco Maria; Pavan, Paolo; Palestri, Pierpaolo; Verzellesi, Giovanni
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Modeling 1/f and Lorenzian noise in III-V MOSFETs | 1-gen-2019 | Caruso, E.; Bettetti, F.; DEL LINZ, Leonida; Pin, D.; Segatto, M.; Palestri, P. | |
| Relationship between capacitance and conductance in MOS capacitors | 1-gen-2019 | Caruso, E.; Lin, J.; Monaghan, S.; Cherkaoui, K.; Floyd, L.; Gity, F.; Palestri, P.; Esseni, D.; Selmi, L.; Hurley, P. K. | |
| The Role of Oxide Traps Aligned With the Semiconductor Energy Gap in {MOS} Systems | 1-gen-2020 | Caruso, Enrico; Lin, Jun; Monaghan, Scott; Cherkaoui, Karim; Gity, Farzan; Palestri, Pierpaolo; Esseni, David; Selmi, Luca; Hurley, Paul K. | |
| Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-of-the-Roadmap III–V MOSFETs | 1-gen-2020 | Zagni, Nicolo; Caruso, Enrico; Puglisi, Francesco Maria; Pavan, Paolo; Palestri, Pierpaolo; Verzellesi, Giovanni |
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