IELLINA, Matteo
IELLINA, Matteo
DIEG - DIPARTIMENTO DI INGEGNERIA ELETTRICA, GESTIONALE E MECCANICA (attivo dal 01/01/1900 al 31/12/2015)
A simulation study of the Punch-through Assisted Hot Holes Injection mechanism for non-volatile-memory cells
2010-01-01 Iellina, Matteo; Palestri, Pierpaolo; Akil, N.; VAN DUUREN, M.; Driussi, Francesco; Esseni, David; Selmi, Luca
An Efficient Nonlocal Hot Electron Model Accounting for Electron–Electron Scattering
2012-01-01 Zaka, A; Palestri, Pierpaolo; Rafhay, Q; Clerc, R; Iellina, Matteo; Rideau, D; Tavernier, C; Pananakis, G; Herven, J; Selmi, Luca
Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices
2012-01-01 DE MICHIELIS, Luca; Iellina, Matteo; Palestri, Pierpaolo; Ionescu, A; Selmi, Luca
On the accuracy of current TCAD hot carrier injection models in nanoscale devices
2010-01-01 A., Zaka; Q., Rafhay; Iellina, Matteo; Palestri, Pierpaolo; R., Clerc; D., Rideau; D., Garetto; E., Dornel; J., Singer; G., Pananakakis; C., Tavernier; H., Jaouen
Programming Efficiency and Drain Disturb Trade-Off in Embedded Non Volatile Memories
2010-01-01 A., Zaka; Palestri, Pierpaolo; D., Rideau; Iellina, Matteo; E., Dormel; Q., Rafhay; C., Tavernier; H., Jaouen
Tunneling path impact on semi-classical numerical simulations of TFET devices
2011-01-01 DE MICHIELIS, Luca; Iellina, Matteo; Palestri, Pierpaolo; Ionescu, A; Selmi, Luca
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A simulation study of the Punch-through Assisted Hot Holes Injection mechanism for non-volatile-memory cells | 1-gen-2010 | Iellina, Matteo; Palestri, Pierpaolo; Akil, N.; VAN DUUREN, M.; Driussi, Francesco; Esseni, David; Selmi, Luca | |
| An Efficient Nonlocal Hot Electron Model Accounting for Electron–Electron Scattering | 1-gen-2012 | Zaka, A; Palestri, Pierpaolo; Rafhay, Q; Clerc, R; Iellina, Matteo; Rideau, D; Tavernier, C; Pananakis, G; Herven, J; Selmi, Luca | |
| Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices | 1-gen-2012 | DE MICHIELIS, Luca; Iellina, Matteo; Palestri, Pierpaolo; Ionescu, A; Selmi, Luca | |
| On the accuracy of current TCAD hot carrier injection models in nanoscale devices | 1-gen-2010 | A., Zaka; Q., Rafhay; Iellina, Matteo; Palestri, Pierpaolo; R., Clerc; D., Rideau; D., Garetto; E., Dornel; J., Singer; G., Pananakakis; C., Tavernier; H., Jaouen | |
| Programming Efficiency and Drain Disturb Trade-Off in Embedded Non Volatile Memories | 1-gen-2010 | A., Zaka; Palestri, Pierpaolo; D., Rideau; Iellina, Matteo; E., Dormel; Q., Rafhay; C., Tavernier; H., Jaouen | |
| Tunneling path impact on semi-classical numerical simulations of TFET devices | 1-gen-2011 | DE MICHIELIS, Luca; Iellina, Matteo; Palestri, Pierpaolo; Ionescu, A; Selmi, Luca |