The unprecedented performance of modern power semiconductors has transformed power electronics by enabling converter operation at higher voltages, switching frequencies, and temperatures. However, for the development of highly efficient and compact converters, precise characterization and modelling of device losses is therefore of paramount importance. In soft-switching applications, an atypical temperature rise has been observed in power devices compared to the values predicted by conventional device models. Several studies have attributed this behaviour to hysteresis effects in the output capacitance (Co) as a potential source of additional losses and have proposed various methodologies for describing and validating the phenomena. However, due to the relatively recent recognition, the concepts and analysis presented thus far remain ambiguous and inconsistent. This paper aims to systematically investigate the potential origins of these dissipative losses, measurement circuits, modelling approaches, and influencing parameters. In addition, a comprehensive discussion of simulation methodologies, a Steinmetz-based empirical, and a novel analytical modelling is provided for accurate estimation of these losses.
Empirical and Analytical Modelling of Capacitance Induced Dissipation Losses in Power Semiconductors
Petrella R.
2026-01-01
Abstract
The unprecedented performance of modern power semiconductors has transformed power electronics by enabling converter operation at higher voltages, switching frequencies, and temperatures. However, for the development of highly efficient and compact converters, precise characterization and modelling of device losses is therefore of paramount importance. In soft-switching applications, an atypical temperature rise has been observed in power devices compared to the values predicted by conventional device models. Several studies have attributed this behaviour to hysteresis effects in the output capacitance (Co) as a potential source of additional losses and have proposed various methodologies for describing and validating the phenomena. However, due to the relatively recent recognition, the concepts and analysis presented thus far remain ambiguous and inconsistent. This paper aims to systematically investigate the potential origins of these dissipative losses, measurement circuits, modelling approaches, and influencing parameters. In addition, a comprehensive discussion of simulation methodologies, a Steinmetz-based empirical, and a novel analytical modelling is provided for accurate estimation of these losses.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
