DE MICHIELIS, Marco

DE MICHIELIS, Marco  

DIEG - DIPARTIMENTO DI INGEGNERIA ELETTRICA, GESTIONALE E MECCANICA (attivo dal 01/01/1900 al 31/12/2015)  

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Titolo Data di pubblicazione Autore(i) File
An efficient, mixed semiclassical/quantum mechanical model to simulate planar and wire nano-transistors 1-gen-2007 Selmi, Luca; Palestri, Pierpaolo; Esseni, David; Lucci, Luca; DE MICHIELIS, Marco
Analytical models for the insight into the use of alternative channel materials in ballistic nano-MOSFETs 1-gen-2007 DE MICHIELIS, Marco; Esseni, David; Driussi, Francesco
Comparison of Semiclassical Transport Formulations Including Quantum Corrections for Advanced Devices with High-K Gate Stacks 1-gen-2010 Bufler, F. M.; AUBRY FORTUNA, V; Bournel, A; Braccioli, M; Dollfus, P; Esseni, David; Fiegna, C; Gamizk, F; DE MICHIELIS, Marco; Palestri, Pierpaolo; SAINT MARTIN, J; Sampedrok, C; Sangiorgi, E; Selmi, Luca; Toniutti, Paolo
Drain current improvements in uniaxially strained p-MOSFETs: A Multi-Subband Monte Carlo study 1-gen-2009 Conzatti, Francesco; DE MICHIELIS, Marco; Esseni, David; Palestri, Pierpaolo
Drain Current Improvements in Uniaxially Strained p-MOSFETs: a Multi-Subband Monte Carlo Study 1-gen-2008 Conzatti, Francesco; DE MICHIELIS, Marco; Esseni, David; Palestri, Pierpaolo
Extraction of h parameter characterising ueff against Eeff curves in strained Si nMOS devices 1-gen-2008 Bennamane, K; DE MICHIELIS, Marco; Ghibaudo, G; Esseni, David
On the origin of the mobility reduction in n- and p-metal-oxide-semiconductor field effect transistors with hafnium-based/metal gate stacks 1-gen-2012 Toniutti, Paolo; Palestri, Pierpaolo; Esseni, David; Driussi, Francesco; DE MICHIELIS, Marco; Selmi, Luca
On the Surface-Roughness Scattering in Biaxially Strained n- and p-MOS Transistors 1-gen-2011 DE MICHIELIS, Marco; Conzatti, Francesco; Esseni, David; Selmi, Luca
Semiclassical Modeling of Quasi-Ballistic Hole Transport in Nanoscale pMOSFETs Based on a Multi-Subband Monte Carlo Approach 1-gen-2009 DE MICHIELIS, Marco; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Trade-off between Electron Velocity and Density of States in Ballistic nano-MOSFETs 1-gen-2005 DE MICHIELIS, Marco; Driussi, Francesco; Esseni, David
Understanding the mobility reduction in MOSFETs featuring high-κ dielectrics 1-gen-2010 Toniutti, Paolo; DE MICHIELIS, Marco; Palestri, Pierpaolo; Driussi, Francesco; Esseni, David; Selmi, Luca