ARREGHINI, Antonio
ARREGHINI, Antonio
DIEG - DIPARTIMENTO DI INGEGNERIA ELETTRICA, GESTIONALE E MECCANICA (attivo dal 01/01/1900 al 31/12/2015)
Analysis of nitride storage non-volatile memories with HfSiO(x) blocking dielectric and TiN metal gate for low power embedded applications
2009-01-01 Golubovic, Ds; van Duuren, Mj; Akil, N; Arreghini, Antonio; Driussi, Francesco
Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells
2009-01-01 Vianello, Elisa; Driussi, Francesco; Arreghini, Antonio; Palestri, Pierpaolo; Esseni, David; Selmi, Luca; N., Akil; M. J., van Duuren; D. S., Golubovic
Experimental characterization of the vertical position of the trapped charge in Si nitride-based nonvolatile memory cells
2008-01-01 Arreghini, A; Driussi, F; Vianello, E; Esseni, D; VAN DUUREN, M. J.; Gobulovic, D. S.; Akil, N; VAN SCHAIJK, R
New Charge Pumping model for the analysis of the spatial trap distribution in the nitride layer of SONOS devices
2005-01-01 Arreghini, Antonio; Driussi, Francesco; Esseni, David; Selmi, Luca; M., VAN DUUREN; R., VAN SCHAIJK
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Analysis of nitride storage non-volatile memories with HfSiO(x) blocking dielectric and TiN metal gate for low power embedded applications | 1-gen-2009 | Golubovic, Ds; van Duuren, Mj; Akil, N; Arreghini, Antonio; Driussi, Francesco | |
| Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells | 1-gen-2009 | Vianello, Elisa; Driussi, Francesco; Arreghini, Antonio; Palestri, Pierpaolo; Esseni, David; Selmi, Luca; N., Akil; M. J., van Duuren; D. S., Golubovic | |
| Experimental characterization of the vertical position of the trapped charge in Si nitride-based nonvolatile memory cells | 1-gen-2008 | Arreghini, A; Driussi, F; Vianello, E; Esseni, D; VAN DUUREN, M. J.; Gobulovic, D. S.; Akil, N; VAN SCHAIJK, R | |
| New Charge Pumping model for the analysis of the spatial trap distribution in the nitride layer of SONOS devices | 1-gen-2005 | Arreghini, Antonio; Driussi, Francesco; Esseni, David; Selmi, Luca; M., VAN DUUREN; R., VAN SCHAIJK |