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Spectroscopic Analysis of Trap Assisted Tunneling on This Oxides by Means of Substrate Hot Electron Injection Experiments
2002-01-01 Driussi, Francesco; Iob, R.; Esseni, David; Selmi, Luca; VAN SCHAIJK, R.; Widdershoven, F.
State-of-the-art semi-classical Monte Carlo method for carrier transport in nanoscale transistors
2015-01-01 Palestri, Pierpaolo; Caruso, Enrico; Driussi, Francesco; Esseni, David; Lizzit, Daniel; Osgnach, Patrik; Venica, Stefano; Selmi, Luca
Study of defects in Al2O3 blocking layers of TANOS memories by atomistic simulation, electrical characterization and physico-chemical material analyses
2011-01-01 Masoero, L.; Molas, G.; Blaise, P.; Colonna, J. P.; Vianello, Elisa; Selmi, Luca; Papon, A. M.; Lafond, D.; Martin, F.; Gely, M.; Licitra, C.; Barnes, J. P.; Ghibaudo, G.; DE SALVO, B.
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs
2002-01-01 Esseni, David; Abramo, Antonio; Selmi, Luca; Sangiorgi, Enrico
Substrate enhanced degradation of cmos devices
2000-01-01 Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza
Substrate Enhanced Gate Currents in CMOS Devices
2000-01-01 Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza; Sangiorgi, Enrico
Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs
2013-01-01 Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Technology Oriented Analytical Models of MOSFETs in the Quasi Ballistic Regime
2007-01-01 Clerc, R; Rafhay, Q; Ferrier, M; Palestri, Pierpaolo; Ghibaudo, G; Selmi, Luca
The Impact of Device Design on the Substrate Enhanced Gate Current of VLSI MOSFET's
1998-01-01 Esseni, David; Selmi, Luca; Bez, R.
The impact of interface states on the mobility and the drive current of III-V MOSFETs
2014-01-01 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Spectroscopic Analysis of Trap Assisted Tunneling on This Oxides by Means of Substrate Hot Electron Injection Experiments | 1-gen-2002 | Driussi, Francesco; Iob, R.; Esseni, David; Selmi, Luca; VAN SCHAIJK, R.; Widdershoven, F. | |
State-of-the-art semi-classical Monte Carlo method for carrier transport in nanoscale transistors | 1-gen-2015 | Palestri, Pierpaolo; Caruso, Enrico; Driussi, Francesco; Esseni, David; Lizzit, Daniel; Osgnach, Patrik; Venica, Stefano; Selmi, Luca | |
Study of defects in Al2O3 blocking layers of TANOS memories by atomistic simulation, electrical characterization and physico-chemical material analyses | 1-gen-2011 | Masoero, L.; Molas, G.; Blaise, P.; Colonna, J. P.; Vianello, Elisa; Selmi, Luca; Papon, A. M.; Lafond, D.; Martin, F.; Gely, M.; Licitra, C.; Barnes, J. P.; Ghibaudo, G.; DE SALVO, B. | |
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs | 1-gen-2002 | Esseni, David; Abramo, Antonio; Selmi, Luca; Sangiorgi, Enrico | |
Substrate enhanced degradation of cmos devices | 1-gen-2000 | Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza | |
Substrate Enhanced Gate Currents in CMOS Devices | 1-gen-2000 | Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza; Sangiorgi, Enrico | |
Surface roughness limited mobility modeling in ultra-thin SOI and quantum well III-V MOSFETs | 1-gen-2013 | Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Technology Oriented Analytical Models of MOSFETs in the Quasi Ballistic Regime | 1-gen-2007 | Clerc, R; Rafhay, Q; Ferrier, M; Palestri, Pierpaolo; Ghibaudo, G; Selmi, Luca | |
The Impact of Device Design on the Substrate Enhanced Gate Current of VLSI MOSFET's | 1-gen-1998 | Esseni, David; Selmi, Luca; Bez, R. | |
The impact of interface states on the mobility and the drive current of III-V MOSFETs | 1-gen-2014 | Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca |
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Tipologia
- 4 Contributo in Atti di Convegno ... 199
- 4 Contributo in Atti di Convegno ... 199
Data di pubblicazione
- 2020 - 2022 3
- 2010 - 2019 74
- 2000 - 2009 84
- 1990 - 1999 36
- 1987 - 1989 2
Editore
- IEEE 37
- Institute of Electrical and Elect... 3
- American Institute of Physics Inc. 1
- DIEGM - Università degli Studi di... 1
- Libreria Progetto 1
- Univeristy of Wuppertal 1
Rivista
- PROCEEDINGS OF THE EUROPEAN SOLID... 2
- AIP CONFERENCE PROCEEDINGS 1
- ECS TRANSACTIONS 1
- MICROELECTRONIC ENGINEERING 1
Keyword
- FinFETs 2
- Gallium arsenide 2
- III-V compounds 2
- Logic gates 2
- nanoribbon 2
- Scattering 2
- Silicon 2
- TCAD 2
- AC 1
- admittance 1
Lingua
- eng 131
- ita 1
Accesso al fulltext
- reserved 117
- no fulltext 71
- restricted 10
- open 1