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Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET
2006-01-01 Ponton, D; Lucci, L; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Back-Scattering in Quasi Ballistic NanoMOSFETs: The Role of Non Thermal Carrier Distributions
2008-01-01 Clerc, R; Palestri, Pierpaolo; Selmi, Luca; Ghibaudo, G.
Backscattering and common-base current gain of the Graphene Base Transistor (GBT)
2015-01-01 Venica, Stefano; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca
Backscattering and common-base current gain of the Graphene Base Transistor (GBT)
2015-01-01 Venica, Stefano; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca
Ballistic Effects in Advanced MOSFETs along the Roadmap
2005-01-01 Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca
Bayesian Estimation for Transport Equations for Nanocapacitors
2018-01-01 Stadlbauer, Benjamin; Taghizadeh, Leila; Morales Escalante, Jose A.; Heitzinger, Clemens; Cossettini, Andrea; Selmi, Luca
Bayesian estimation of physical and geometrical parameters for nanocapacitor array biosensors
2019-01-01 Stadlbauer, Benjamin; Cossettini, Andrea; Morales E., José A.; Pasterk, Daniel; Scarbolo, Paolo; Taghizadeh, Leila; Heitzinger, Clemens; Selmi, Luca
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits
2017-01-01 Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS technology node considering 28T Full-Adders
2016-01-01 Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca
Bias and Temperature Dependence of Homogeneous Hot-Electron Injection from Silicon into Silicon Dioxide at Low Voltages
1997-01-01 Fischer, B; Ghetti, A; Selmi, Luca; Bez, R; Sangiorgi, Enrico
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Assessment of the Impact of Biaxial Strain on the Drain Current of Decanometric n-MOSFET | 1-gen-2006 | Ponton, D; Lucci, L; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
Back-Scattering in Quasi Ballistic NanoMOSFETs: The Role of Non Thermal Carrier Distributions | 1-gen-2008 | Clerc, R; Palestri, Pierpaolo; Selmi, Luca; Ghibaudo, G. | |
Backscattering and common-base current gain of the Graphene Base Transistor (GBT) | 1-gen-2015 | Venica, Stefano; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca | |
Backscattering and common-base current gain of the Graphene Base Transistor (GBT) | 1-gen-2015 | Venica, Stefano; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca | |
Ballistic Effects in Advanced MOSFETs along the Roadmap | 1-gen-2005 | Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca | |
Bayesian Estimation for Transport Equations for Nanocapacitors | 1-gen-2018 | Stadlbauer, Benjamin; Taghizadeh, Leila; Morales Escalante, Jose A.; Heitzinger, Clemens; Cossettini, Andrea; Selmi, Luca | |
Bayesian estimation of physical and geometrical parameters for nanocapacitor array biosensors | 1-gen-2019 | Stadlbauer, Benjamin; Cossettini, Andrea; Morales E., José A.; Pasterk, Daniel; Scarbolo, Paolo; Taghizadeh, Leila; Heitzinger, Clemens; Selmi, Luca | |
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS FinFET technology node considering basic arithmetic circuits | 1-gen-2017 | Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca | |
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS technology node considering 28T Full-Adders | 1-gen-2016 | Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca | |
Bias and Temperature Dependence of Homogeneous Hot-Electron Injection from Silicon into Silicon Dioxide at Low Voltages | 1-gen-1997 | Fischer, B; Ghetti, A; Selmi, Luca; Bez, R; Sangiorgi, Enrico |
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Tipologia
- 4 Contributo in Atti di Convegno ... 206
- 4 Contributo in Atti di Convegno ... 199
- 1 Contributo su Rivista 166
- 1 Contributo su Rivista::1.1 Arti... 166
- 2 Contributo in Volume 7
- 2 Contributo in Volume::2.1 Contr... 7
- 4 Contributo in Atti di Convegno ... 7
- 5 Altro 6
- 7 Curatele 5
- 7 Curatele::7.1 Curatela 5
- 5 Altro::5.12 Altro 4
- 3 Libro 3
- 3 Libro::3.1 Monografia o trattat... 3
- 5 Altro::5.11 Software 2
- 6 Brevetti 2
- 6 Brevetti::6.1 Brevetto 2
Data di pubblicazione
- 2020 - 2023 9
- 2010 - 2019 156
- 2000 - 2009 159
- 1990 - 1999 63
- 1987 - 1989 8
Editore
- IEEE 38
- IEEE / Institute of Electrical an... 7
- Institute of Electrical and Elect... 3
- Wiley 3
- Elsevier BV:PO Box 211, 1000 AE A... 2
- Society for Industrial and Applie... 2
- American Institute of Physics Inc. 1
- Cambridge University Press 1
- DIEGM - Università degli Studi di... 1
- Elsevier Science BV 1
Rivista
- IEEE TRANSACTIONS ON ELECTRON DEV... 66
- SOLID-STATE ELECTRONICS 31
- IEEE ELECTRON DEVICE LETTERS 11
- MICROELECTRONIC ENGINEERING 9
- ECS TRANSACTIONS 3
- IEEE JOURNAL OF SOLID-STATE CIRCUITS 3
- IEEE TRANSACTIONS ON CIRCUITS AND... 3
- JOURNAL OF APPLIED PHYSICS 3
- IEEE TRANSACTIONS ON DEVICE AND M... 2
- IEEE TRANSACTIONS ON NANOTECHNOLOGY 2
Keyword
- TCAD 7
- Monte Carlo 6
- Electrical and Electronic Enginee... 5
- Electronic 5
- Optical and Magnetic Materials 5
- Simulation 5
- Tunnel-FET 5
- Condensed Matter Physics 4
- Modeling 4
- Charge trapping 3
Lingua
- eng 286
- ita 3
Accesso al fulltext
- reserved 237
- no fulltext 125
- restricted 15
- partially open 12
- open 6