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Mostrati risultati da 21 a 40 di 352
Titolo Data di pubblicazione Autore(i) File
Injection Efficiency of CHISEL Gate Currents in Short MOS Devices: Physical Mechanisms, Device Implications and Sensitivity to Technological Parameters", 1-gen-2000 Esseni, David; Selmi, Luca; A., Ghetti; Sangiorgi, Enrico
Deuterium Effect on Interface States and SILC Generation in the CHE Stress Conditions: A Comparative Study 1-gen-2000 Esseni, David; Bude, J.; Selmi, Luca
On the origin of the dispersion of erased threshold voltages in flash eeprom memory cells 1-gen-2000 Esseni, David; Ricco, B.
Trading-Off Programming Speed and Current Absorption in Flash Memories with the Ramped-Gate Programming Technique 1-gen-2000 Esseni, David; C., Villa; S. TASSAN AND B., Ricco
Substrate enhanced degradation of cmos devices 1-gen-2000 Driussi, Francesco; Esseni, David; Selmi, Luca; F., Piazza
An Experimental Study of Low Field Electron Mobility in Double-Gate, Ultra-Thin SOI MOSFETs 1-gen-2001 Esseni, David; M., Mastrapasqua; C., Fiegna; G. K., Celler; Selmi, Luca; Sangiorgi, Enrico
Controlled Hot-Electrons Writing Method for Non-Volatile Memory Cells 1-gen-2001 Esseni, David; P., Cappelletti; B., Ricco
Mobility in Single and Double Gate Ultra-Thin SOI MOSFETs 1-gen-2001 Esseni, David; M., Mastrapasqua; C., Fiegna; G. K., Celler; Selmi, Luca; E., Sangiorgi
Bandwidth Optimizatoin of Flash Memories with the RGP Technique 1-gen-2001 R., Versari; Esseni, David; G., Falavigna; M., Lanzoni; B., Ricco
Low Field Electron and Hole Mobility of SOI Transistors Fabricated on Ultra-Thin Silicon Films for Deep Sub-Micron Technology Application 1-gen-2001 Esseni, David; Mastrapasqua, M.; Celler, G.; Fiegna, C.; Selmi, Luca
Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides 1-gen-2001 Esseni, David; Bude, J; Selmi, Luca
Hot Hole Gate Current in Surface Channel p-MOSFETs 1-gen-2001 Driussi, Francesco; Esseni, David; Selmi, Luca; Piazza, F.
Measurements of Low Field Mobility in Ultra Thin SOI n- and p-MOSFETs 1-gen-2001 Mastrapasqua, M; Esseni, David; Celler, G. K.; Fiegna, C; Selmi, Luca; Sangiorgi, Enrico
Optimized Programming of Multilevel Flash EEPROMs 1-gen-2001 R., Versari; Esseni, David; G., Falavigna; M., Lanzoni; B., Ricco
Microscopic Analysis of the Impact of Substrate Bias on the Gate Current of pMOSFETs 1-gen-2001 Zanchetta, Sergio; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
BipFLASH: a Novel Non-Volatile Memory Cell Concept for High Speed - Low Power Applications 1-gen-2001 Esseni, David; Selmi, Luca
Bipolar Flash Memory (BipFlash) - A new Architecture for a Non-Volatile Memory with a High Programming Efficiency 1-gen-2002 Esseni, David; Selmi, Luca; R., Bez; A., Modelli
Ultra Thin Single and Double-Gate MOSFETs for Future ULSI Applications: Measurements, Simulations and Open Issues 1-gen-2002 Esseni, David; Fiegna, C.; Mastrapasqua, M.
On Interface and Oxide Degradation in VLSI MOSFETs, Part II: Fowler-Nordheim Stress Regime 1-gen-2002 Esseni, David; Bude, J.; Selmi, Luca
Damage generation and location in n- and p-MOSFETs biased in the substrate-enhanced gate current regime 1-gen-2002 Driussi, Francesco; Esseni, David; Selmi, Luca; Fausto, Piazza
Mostrati risultati da 21 a 40 di 352
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