IELLINA, Matteo
 Distribuzione geografica
Continente #
NA - Nord America 427
AS - Asia 130
EU - Europa 122
SA - Sud America 17
AF - Africa 2
Totale 698
Nazione #
US - Stati Uniti d'America 420
SG - Singapore 63
DE - Germania 33
CN - Cina 31
UA - Ucraina 31
FI - Finlandia 15
HK - Hong Kong 12
RU - Federazione Russa 11
BR - Brasile 10
IT - Italia 10
TR - Turchia 9
CA - Canada 7
FR - Francia 6
IE - Irlanda 6
GB - Regno Unito 5
VN - Vietnam 4
AR - Argentina 3
CL - Cile 2
IL - Israele 2
IN - India 2
PK - Pakistan 2
AZ - Azerbaigian 1
BD - Bangladesh 1
BH - Bahrain 1
EC - Ecuador 1
ES - Italia 1
GY - Guiana 1
JP - Giappone 1
MA - Marocco 1
MK - Macedonia 1
NL - Olanda 1
PL - Polonia 1
SE - Svezia 1
TH - Thailandia 1
ZA - Sudafrica 1
Totale 698
Città #
Woodbridge 68
Fairfield 55
Ashburn 42
Chandler 31
Beijing 24
Seattle 24
Singapore 24
Jacksonville 22
Wilmington 22
Houston 20
Cambridge 17
Dearborn 12
Hong Kong 12
Izmir 8
Munich 8
Boardman 7
Ann Arbor 6
Dublin 6
Princeton 6
Dallas 4
New York 4
San Diego 4
Los Angeles 3
Montreal 3
Ottawa 3
Redondo Beach 3
Turku 3
Biên Hòa 2
Bologna 2
Buffalo 2
Ogden 2
San Francisco 2
São Paulo 2
Tel Aviv 2
Amsterdam 1
Annapolis 1
Baie-D'Urfé 1
Baku 1
Boston 1
Brooklyn 1
Cape Town 1
Carney 1
Chennai 1
Cidade Ocidental 1
Cruz Machado 1
Denver 1
Düsseldorf 1
Georgetown 1
Guayaquil 1
Hanoi 1
Hefei 1
Islamabad 1
Jacundá 1
Jaguariaíva 1
Karachi 1
Kunming 1
Laferrere 1
Manama 1
Manchester 1
Mersin 1
Miguel Pereira 1
Neubiberg 1
New Delhi 1
Orem 1
Paris 1
Passos 1
Portsmouth 1
Rome 1
San Miguel de Tucumán 1
Santa Clara 1
Santiago 1
Sorocaba 1
Stockholm 1
Tandil 1
The Bronx 1
Tokyo 1
Udine 1
Udon Thani 1
Viçosa do Ceará 1
Vĩnh Long 1
Warsaw 1
Xiamen 1
Totale 503
Nome #
Effect of the choice of the tunnelling path on semi-classical numerical simulations of TFET devices 136
Tunneling path impact on semi-classical numerical simulations of TFET devices 122
On the accuracy of current TCAD hot carrier injection models in nanoscale devices 122
Programming Efficiency and Drain Disturb Trade-Off in Embedded Non Volatile Memories 121
An Efficient Nonlocal Hot Electron Model Accounting for Electron–Electron Scattering 103
A simulation study of the Punch-through Assisted Hot Holes Injection mechanism for non-volatile-memory cells 94
Totale 698
Categoria #
all - tutte 2.632
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 2.632


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202138 0 0 0 0 0 7 4 6 9 2 8 2
2021/202246 2 4 0 2 0 3 2 2 0 9 16 6
2022/202354 6 12 0 9 6 11 0 1 7 0 1 1
2023/202431 4 4 0 0 3 5 0 0 2 6 0 7
2024/2025108 5 7 8 0 6 5 7 2 17 8 18 25
2025/2026113 16 19 11 20 45 2 0 0 0 0 0 0
Totale 698