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Ballistic Effects in Advanced MOSFETs along the Roadmap
2005-01-01 Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca
Bayesian Estimation for Transport Equations for Nanocapacitors
2018-01-01 Stadlbauer, Benjamin; Taghizadeh, Leila; Morales Escalante, Jose A.; Heitzinger, Clemens; Cossettini, Andrea; Selmi, Luca
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS technology node considering 28T Full-Adders
2016-01-01 Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca
Bias and Temperature Dependence of Gate and Substrate Currents in n-MOSFETs at Low Drain Voltage
1994-01-01 Esseni, David; Selmi, Luca; R., Bez; Sangiorgi, Enrico; B., Ricco
Calibration of High-Frequency Impedance Spectroscopy Measurements with Nanocapacitor Arrays
2019-01-01 Cossettini, Andrea; Selmi, Luca
Calibration, Compensation, Parameter Estimation, and Uncertainty Quantification for Nanoelectrode Array Biosensors
2018-01-01 Cossettini, Andrea; Scarbolo, Paolo; Morales Escalante, Jose A.; Benjamin, Stadlbauer; Naseer, Muhammad; Leila, Taghizadeh; Clemens, Heitzinger; Selmi, Luca
Carrier Quantization in SOI MOSFETs using an Effective Potential Based Monte-Carlo Tool
2003-01-01 Palestri, Pierpaolo; Esseni, David; Abramo, Antonio; Clerc, R; Selmi, Luca
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven
Characterization and Modeling of Hot-Carrier Luminescence in Silicon n+/n/n+ Devices
1995-01-01 Selmi, Luca; Mastrapasqua, M; Boulin, D. M.; Bude, J; Manfredi, M; Sangiorgi, Enrico; Pinto, M. R.
Characterization and Modeling of long term retention in SONOS Non Volatile Memories
2007-01-01 Arreghini, A; Akil, N; Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Ballistic Effects in Advanced MOSFETs along the Roadmap | 1-gen-2005 | Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca | |
Bayesian Estimation for Transport Equations for Nanocapacitors | 1-gen-2018 | Stadlbauer, Benjamin; Taghizadeh, Leila; Morales Escalante, Jose A.; Heitzinger, Clemens; Cossettini, Andrea; Selmi, Luca | |
Benchmarks of a III-V TFET technology platform against the 10-nm CMOS technology node considering 28T Full-Adders | 1-gen-2016 | Strangio, Sebastiano; Palestri, Pierpaolo; Lanuzza, M.; Esseni, David; Crupi, F.; Selmi, Luca | |
Bias and Temperature Dependence of Gate and Substrate Currents in n-MOSFETs at Low Drain Voltage | 1-gen-1994 | Esseni, David; Selmi, Luca; R., Bez; Sangiorgi, Enrico; B., Ricco | |
Calibration of High-Frequency Impedance Spectroscopy Measurements with Nanocapacitor Arrays | 1-gen-2019 | Cossettini, Andrea; Selmi, Luca | |
Calibration, Compensation, Parameter Estimation, and Uncertainty Quantification for Nanoelectrode Array Biosensors | 1-gen-2018 | Cossettini, Andrea; Scarbolo, Paolo; Morales Escalante, Jose A.; Benjamin, Stadlbauer; Naseer, Muhammad; Leila, Taghizadeh; Clemens, Heitzinger; Selmi, Luca | |
Carrier Quantization in SOI MOSFETs using an Effective Potential Based Monte-Carlo Tool | 1-gen-2003 | Palestri, Pierpaolo; Esseni, David; Abramo, Antonio; Clerc, R; Selmi, Luca | |
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven | |
Characterization and Modeling of Hot-Carrier Luminescence in Silicon n+/n/n+ Devices | 1-gen-1995 | Selmi, Luca; Mastrapasqua, M; Boulin, D. M.; Bude, J; Manfredi, M; Sangiorgi, Enrico; Pinto, M. R. | |
Characterization and Modeling of long term retention in SONOS Non Volatile Memories | 1-gen-2007 | Arreghini, A; Akil, N; Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J. |
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- 4 Contributo in Atti di Convegno ... 206
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Data di pubblicazione
- 2020 - 2022 3
- 2010 - 2019 80
- 2000 - 2009 85
- 1990 - 1999 36
- 1987 - 1989 2
Editore
- IEEE 37
- Institute of Electrical and Elect... 3
- Society for Industrial and Applie... 2
- American Institute of Physics Inc. 1
- DIEGM - Università degli Studi di... 1
- Libreria Progetto 1
- Univeristy of Wuppertal 1
Rivista
- PROCEEDINGS OF THE EUROPEAN SOLID... 2
- AIP CONFERENCE PROCEEDINGS 1
- ECS TRANSACTIONS 1
- MICROELECTRONIC ENGINEERING 1
Keyword
- FinFETs 2
- Gallium arsenide 2
- III-V compounds 2
- Logic gates 2
- nanoribbon 2
- Scattering 2
- Silicon 2
- TCAD 2
- AC 1
- admittance 1
Lingua
- eng 138
- ita 1
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