We report results on drift velocity monitoring using MOS charge injectors in silicon drift detectors obtained in beam test conditions. The correction of velocity variations as small as 0.03% caused by temperature variations of the order of 0.04 K allowed to get an average space resolution along all the drift path of 28 mum. Preliminary result demonstrating the possibility to correct for temperature gradients along the anode axis are also presented. (C) 2002 Elsevier Science B.V. All rights reserved.
|Titolo:||Beam test results of a drift velocity monitoring system for silicon drift detectors|
|Data di pubblicazione:||2002|
|Appare nelle tipologie:||1.1 Articolo in rivista|