CINECA IRIS Institutional Research Information System
IRIS è la piattaforma adottata dall’Università degli Studi di Udine per gestire l’archivio aperto dei prodotti della ricerca. L’archivio contiene articoli, contributi in volume, monografie, interventi pubblicati in atti di convegno, Tesi di dottorato e altri materiali.
EnglishThe transfer Length Method is a well–established experimental technique to characterize the contact resistance in semiconductor devices. However, its dependability is questioned for metal–graphene contacts. We investigate in–depth the statistical error of the extracted contact resistance values and we devise strategies to limit such error and to obtain reliable results. The method has been successfully applied to samples with different contact metals.
| Titolo: | Reliability analysis of the metal-graphene contact resistance extracted by the transfer length method | |
| Autori: | ||
| Data di pubblicazione: | 2018 | |
| Abstract: | The transfer Length Method is a well–established experimental technique to characterize the contact resistance in semiconductor devices. However, its dependability is questioned for metal–graphene contacts. We investigate in–depth the statistical error of the extracted contact resistance values and we devise strategies to limit such error and to obtain reliable results. The method has been successfully applied to samples with different contact metals. | |
| Handle: | http://hdl.handle.net/11390/1134935 | |
| ISBN: | 978-1-5386-5069-1 978-1-5386-5071-4 | |
| Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| venica_ICMTS_2018.pdf | Documento in Pre-print | Non pubblico | Accesso ristretto Richiedi una copia |
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11390/1134935
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
Copyright © 2021