This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).

XRF topography information: Simulations and data from a novel silicon drift detector system

Cirrincione, D.;Vacchi, A.;
2018-01-01

Abstract

This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11390/1142261
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