A Fluorescence Detector System for X-ray Absorption Fine Structure (XAFS), composed of 8 monolithic arrays of Silicon Drift Detectors (SDDs), each having 8 cells of 9 mm2 area, is being realized within the INFN ReDSoX Collaboration. It will be used for X-ray absorption spectroscopy at the Jordanian synchrotron light source SESAME, which provides a photon beam with an energy range between 3 and 30 keV. Detailed characterization tests at Elettra Sincrotrone Trieste have demonstrated an energy resolution at the Mn 5.9 keV Ka line, for the monolithic array, below 170 eV FWHM at room temperature.
First characterization of the detector system for the XAFS beam-line of the synchrotron light source SESAME
Cirrincione D.
Primo
2019-01-01
Abstract
A Fluorescence Detector System for X-ray Absorption Fine Structure (XAFS), composed of 8 monolithic arrays of Silicon Drift Detectors (SDDs), each having 8 cells of 9 mm2 area, is being realized within the INFN ReDSoX Collaboration. It will be used for X-ray absorption spectroscopy at the Jordanian synchrotron light source SESAME, which provides a photon beam with an energy range between 3 and 30 keV. Detailed characterization tests at Elettra Sincrotrone Trieste have demonstrated an energy resolution at the Mn 5.9 keV Ka line, for the monolithic array, below 170 eV FWHM at room temperature.File in questo prodotto:
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