The five invited papers and 11 contributed papers in this special issue discuss topics such as process variation, device variability, hierarchical modeling tools, and address challenges such as device mismatch and SRAM noise margin variability.
Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements
ESSENI, David;
2011-01-01
Abstract
The five invited papers and 11 contributed papers in this special issue discuss topics such as process variation, device variability, hierarchical modeling tools, and address challenges such as device mismatch and SRAM noise margin variability.File in questo prodotto:
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