OSGNACH, Patrik
OSGNACH, Patrik
DIEG - DIPARTIMENTO DI INGEGNERIA ELETTRICA, GESTIONALE E MECCANICA (attivo dal 01/01/1900 al 31/12/2015)
An Improved Semi-classical Approach for Simulating Tunnel-FETs
2012-01-01 Revelant, Alberto; Osgnach, Patrik; Palestri, Pierpaolo; Selmi, Luca
An Improved Semi-Classical Model to Investigate Tunnel-FET performance
2013-01-01 Revelant, Alberto; Osgnach, Patrik; Palestri, Pierpaolo; Selmi, Luca
An Improved Surface Roughness Scattering Model for Bulk, Thin-Body, and Quantum-Well MOSFETs
2016-01-01 Badami, Oves Mohamed Hussein; Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Calibrated multi-subband Monte Carlo modeling of tunnel-FETs in silicon and III–V channel materials
2013-01-01 Revelant, Alberto; Palestri, Pierpaolo; Osgnach, Patrik; Selmi, Luca
Comprehensive comparison and experimental validation of band-structure calculation methods in III–V semiconductor quantum wells
2016-01-01 Zerveas, George; Caruso, Enrico; Baccarani, Giorgio; Czornomaz, Lukas; Daix, Nicolas; Esseni, David; Gnani, Elena; Gnudi, Antonio; Grassi, Roberto; Luisier, Mathieu; Markussen, Troels; Osgnach, Patrik; Palestri, Pierpaolo; Schenk, Andreas; Selmi, Luca; Sousa, Marilyne; Stokbro, Kurt; Visciarelli, Michele
Development and Optimisation of Advanced Simulation Models for Nanoscale FETs with Alternative Channel Materials
2015-04-08 Osgnach, Patrik
Low-voltage high-performance III-V semiconductor MOSFETs for advanced CMOS nodes: impact of strain and interface traps
2015-01-01 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
On the Optimization of SiGe and III-V Compound Hetero-Junction Tunnel FET Devices
2013-01-01 Revelant, Alberto; Palestri, Pierpaolo; Osgnach, Patrik; Lizzit, Daniel; Selmi, Luca
Performance Benchmarking and Effective Channel Length for Nanoscale InAs, In0.53Ga0.47As, and sSi n-MOSFETs
2014-01-01 Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Osgnach, Patrik; Selmi, Luca
Performance Study of Strained III-V Materials for Ultra-Thin Body Transistor Applications
2016-01-01 Rau, Martin; Markussen, Troels; Caruso, Enrico; Esseni, David; Gnani, Elena; Gnudi, Antonio; Khomyakov, Petr A.; Luisier, Mathieu; Osgnach, Patrik; Palestri, Pierpaolo; Reggiani, Susanna; Schenk, Andreas; Selmi, Luca; Stokbro, Kurt
Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain
2015-01-01 Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
State-of-the-art semi-classical Monte Carlo method for carrier transport in nanoscale transistors
2015-01-01 Palestri, Pierpaolo; Caruso, Enrico; Driussi, Francesco; Esseni, David; Lizzit, Daniel; Osgnach, Patrik; Venica, Stefano; Selmi, Luca
The impact of interface states on the mobility and drive current of In 0.53Ga 0.47As semiconductor n-MOSFETs
2015-01-01 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
The impact of interface states on the mobility and the drive current of III-V MOSFETs
2014-01-01 Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Toward computationally efficient Multi-Subband Monte Carlo simulations of nanoscale MOSFETs
2013-01-01 Osgnach, Patrik; Revelant, Alberto; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
An Improved Semi-classical Approach for Simulating Tunnel-FETs | 1-gen-2012 | Revelant, Alberto; Osgnach, Patrik; Palestri, Pierpaolo; Selmi, Luca | |
An Improved Semi-Classical Model to Investigate Tunnel-FET performance | 1-gen-2013 | Revelant, Alberto; Osgnach, Patrik; Palestri, Pierpaolo; Selmi, Luca | |
An Improved Surface Roughness Scattering Model for Bulk, Thin-Body, and Quantum-Well MOSFETs | 1-gen-2016 | Badami, Oves Mohamed Hussein; Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Calibrated multi-subband Monte Carlo modeling of tunnel-FETs in silicon and III–V channel materials | 1-gen-2013 | Revelant, Alberto; Palestri, Pierpaolo; Osgnach, Patrik; Selmi, Luca | |
Comprehensive comparison and experimental validation of band-structure calculation methods in III–V semiconductor quantum wells | 1-gen-2016 | Zerveas, George; Caruso, Enrico; Baccarani, Giorgio; Czornomaz, Lukas; Daix, Nicolas; Esseni, David; Gnani, Elena; Gnudi, Antonio; Grassi, Roberto; Luisier, Mathieu; Markussen, Troels; Osgnach, Patrik; Palestri, Pierpaolo; Schenk, Andreas; Selmi, Luca; Sousa, Marilyne; Stokbro, Kurt; Visciarelli, Michele | |
Development and Optimisation of Advanced Simulation Models for Nanoscale FETs with Alternative Channel Materials | 8-apr-2015 | Osgnach, Patrik | |
Low-voltage high-performance III-V semiconductor MOSFETs for advanced CMOS nodes: impact of strain and interface traps | 1-gen-2015 | Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
On the Optimization of SiGe and III-V Compound Hetero-Junction Tunnel FET Devices | 1-gen-2013 | Revelant, Alberto; Palestri, Pierpaolo; Osgnach, Patrik; Lizzit, Daniel; Selmi, Luca | |
Performance Benchmarking and Effective Channel Length for Nanoscale InAs, In0.53Ga0.47As, and sSi n-MOSFETs | 1-gen-2014 | Lizzit, Daniel; Esseni, David; Palestri, Pierpaolo; Osgnach, Patrik; Selmi, Luca | |
Performance Study of Strained III-V Materials for Ultra-Thin Body Transistor Applications | 1-gen-2016 | Rau, Martin; Markussen, Troels; Caruso, Enrico; Esseni, David; Gnani, Elena; Gnudi, Antonio; Khomyakov, Petr A.; Luisier, Mathieu; Osgnach, Patrik; Palestri, Pierpaolo; Reggiani, Susanna; Schenk, Andreas; Selmi, Luca; Stokbro, Kurt | |
Simulation analysis of III-V n-MOSFETs: channel materials, Fermi level pinning and biaxial strain | 1-gen-2015 | Caruso, Enrico; Lizzit, Daniel; Osgnach, Patrik; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
State-of-the-art semi-classical Monte Carlo method for carrier transport in nanoscale transistors | 1-gen-2015 | Palestri, Pierpaolo; Caruso, Enrico; Driussi, Francesco; Esseni, David; Lizzit, Daniel; Osgnach, Patrik; Venica, Stefano; Selmi, Luca | |
The impact of interface states on the mobility and drive current of In 0.53Ga 0.47As semiconductor n-MOSFETs | 1-gen-2015 | Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
The impact of interface states on the mobility and the drive current of III-V MOSFETs | 1-gen-2014 | Osgnach, Patrik; Caruso, Enrico; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
Toward computationally efficient Multi-Subband Monte Carlo simulations of nanoscale MOSFETs | 1-gen-2013 | Osgnach, Patrik; Revelant, Alberto; Lizzit, Daniel; Palestri, Pierpaolo; Esseni, David; Selmi, Luca |