SANGIORGI, Enrico
 Distribuzione geografica
Continente #
NA - Nord America 4.184
AS - Asia 1.629
EU - Europa 1.052
SA - Sud America 353
AF - Africa 46
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 1
Totale 7.270
Nazione #
US - Stati Uniti d'America 4.141
SG - Singapore 810
UA - Ucraina 342
BR - Brasile 289
CN - Cina 269
DE - Germania 235
HK - Hong Kong 161
VN - Vietnam 157
FI - Finlandia 120
RU - Federazione Russa 96
FR - Francia 65
TR - Turchia 56
SE - Svezia 55
IE - Irlanda 50
IN - India 39
IT - Italia 31
KR - Corea 28
CA - Canada 27
GB - Regno Unito 27
BD - Bangladesh 24
AR - Argentina 22
EC - Ecuador 18
ZA - Sudafrica 15
ID - Indonesia 14
IQ - Iraq 13
MX - Messico 12
MA - Marocco 10
PK - Pakistan 8
PY - Paraguay 7
CL - Cile 6
NL - Olanda 6
DZ - Algeria 5
JO - Giordania 5
PL - Polonia 5
BE - Belgio 4
CO - Colombia 4
JP - Giappone 4
PH - Filippine 4
TW - Taiwan 4
AE - Emirati Arabi Uniti 3
EG - Egitto 3
ES - Italia 3
EU - Europa 3
KE - Kenya 3
MY - Malesia 3
PS - Palestinian Territory 3
TH - Thailandia 3
TN - Tunisia 3
UZ - Uzbekistan 3
AL - Albania 2
AT - Austria 2
BO - Bolivia 2
CZ - Repubblica Ceca 2
ET - Etiopia 2
GR - Grecia 2
IR - Iran 2
KG - Kirghizistan 2
KZ - Kazakistan 2
NP - Nepal 2
OM - Oman 2
PA - Panama 2
SA - Arabia Saudita 2
UY - Uruguay 2
VE - Venezuela 2
XK - ???statistics.table.value.countryCode.XK??? 2
AU - Australia 1
AZ - Azerbaigian 1
BN - Brunei Darussalam 1
CH - Svizzera 1
CY - Cipro 1
DO - Repubblica Dominicana 1
HU - Ungheria 1
IL - Israele 1
KH - Cambogia 1
KW - Kuwait 1
MG - Madagascar 1
NI - Nicaragua 1
NO - Norvegia 1
PT - Portogallo 1
RS - Serbia 1
SD - Sudan 1
SR - Suriname 1
TG - Togo 1
TZ - Tanzania 1
ZW - Zimbabwe 1
Totale 7.270
Città #
Woodbridge 597
Ann Arbor 493
Fairfield 405
Singapore 263
Houston 255
Jacksonville 251
Chandler 243
Ashburn 231
Wilmington 176
Cambridge 171
Seattle 169
Hong Kong 159
Beijing 138
Dearborn 122
New York 114
Boardman 68
Ho Chi Minh City 57
Princeton 57
Lauterbourg 54
The Dalles 52
Dublin 50
Izmir 48
Los Angeles 43
San Jose 42
Buffalo 36
Hanoi 35
Hefei 28
Seoul 27
Grafing 25
São Paulo 24
San Diego 21
San Mateo 21
Dallas 17
Ottawa 17
Des Moines 13
Norwalk 13
Santa Clara 11
Düsseldorf 10
Ogden 10
Quito 9
Udine 9
Belo Horizonte 8
Helsinki 8
Mumbai 8
Brasília 7
Haiphong 7
Johannesburg 7
Orem 7
Redondo Beach 7
Kunming 6
Moscow 6
Rio de Janeiro 6
Amman 5
Baghdad 5
Chennai 5
Chicago 5
Curitiba 5
Da Nang 5
Frankfurt am Main 5
Hải Dương 5
Nanjing 5
Porto Alegre 5
Shanghai 5
Warsaw 5
Anápolis 4
Asunción 4
Casablanca 4
Caxias do Sul 4
Denver 4
Dhaka 4
Hangzhou 4
Montreal 4
Munich 4
New Delhi 4
Poplar 4
Salvador 4
Tokyo 4
Agadir 3
Atlanta 3
Brooklyn 3
Brussels 3
Bến Cầu 3
Cuiabá 3
Divinópolis 3
Fortaleza 3
Jacareí 3
Lahore 3
London 3
Maceió 3
Mauá 3
Nairobi 3
New Taipei 3
Palaiseau 3
Phoenix 3
Quận Bình Thạnh 3
Resistencia 3
Rome 3
Rosario 3
Santo André 3
Simi Valley 3
Totale 4.842
Nome #
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors 213
An Experimental Study of Low Field Electron Mobility in Double-Gate, Ultra-Thin SOI MOSFETs 198
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 192
A Study of Injection Conditions in the Substrate Hot Electron Induced Degradation of n-MOSFETs 180
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 175
Layout dependence of CMOS Latch-up 175
A Comparative Study of Hot-Carrier Induced Light Emission and Degradation in Bulk and SOI MOSFETs 170
A novel method to determine the Source and Drain resistances of individual MOSFETs 164
A combined transport-injection model for hot-electron and hot-hole injection in the gate oxide of MOS structures 163
Analysis of Uniform Degradation in n-MOSFETs 162
Monitoring Hot Carrier Degradation in SOI MOSFETs by Hot Carrier Luminescence Techniques 161
Latch-up in CMOS circuits: a review 159
Bias and Temperature Dependence of Homogeneous Hot-Electron Injection from Silicon into Silicon Dioxide at Low Voltages 157
Impact Ionization and Photon Emission in MOS Capacitors and FETs 155
Monte-Carlo simulation of MOSFETs with band offsets in the source and drain 154
An Improved Test Structure to Characterize Ultra- Low Hot Carrier Injection in Homogeneous Conditions 152
Parameter extraction from I-V characteristics of single MOSFETs 152
Hysteresis cycle in the Latch-up characteristic of wide CMOS structures 146
Physically Based modeling of Low Field Electron Mobility in Ultrathin Single- and Double-Gate SOI n-MOSFETs 145
Bias and Temperature Dependence of Gate and Substrate Currents in n-MOSFETs at Low Drain Voltage 144
Energy Dependent Electron and Hole Impact Ionization in Si Bipolar Transistors 142
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors 141
Device simulation for decananometer MOSFETs 140
Photon Emission from sub-micron p-channel MOSFETs Biased at High Fields 136
Evidence of Substrate Enhanced High Energy Tails in the Distribution Function of Deep Submicron MOSFETs by Light Emission Measurements 132
Non-Local Effects in p-MOSFET Substrate Hot Hole Injection Experiments 131
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs 131
Characterization and Modeling of Hot-Carrier Luminescence in Silicon n+/n/n+ Devices 128
Oxide Field Dependence of Electron Injection From Silicon into Silicon Dioxide 126
Analysis of highly non-uniform collector doping profiles for the optimization of the breakdown / speed trade off in advanced BJTs 126
Two-dimensional quantum mechanical simulation of charge distribution in silicon MOSFETs 125
Two dimensional quantum simulation of silicon MOSFETs 124
A better insight in the performance of silicon bjt's featuring highly non-uniform collector doping profiles 124
Injection Efficiency of CHISEL Gate Currents in Short MOS Devices: Physical Mechanisms, Device Implications and Sensitivity to Technological Parameters", 121
Experimental Analysis of Polarization in the Hot-Carrier Luminescence of Silicon Devices 121
Non Local Electron and Hole Impact Ionization in Advanced Si BJTs 120
Measurements of Low Field Mobility in Ultra Thin SOI n- and p-MOSFETs 113
Monte Carlo Simulation of Low Voltage Hot Carrier Effects in Non Volatile Memory Cells 113
Substrate Enhanced Gate Currents in CMOS Devices 112
Coupled Monte Carlo Simulation of Si and SiO2 Transport in MOS Capacitors 107
Low Field Mobility of Ultra Thin SOI n- and p-MOSFETs: Measurement and Implications on the Performance of Ultra Short MOSFETs 107
Electron Injection in the Gate Oxide of MOS Structures at Liquid Nitrogen Temperature: Measurement and Simulation 106
Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs 103
A Test Chip and an Accurate Measurement System to Characterize Hot Hole Injection in the Gate Oxide of p-MOSFET’s 103
Hot-Electron induced Photon Energies in n-channel MOSFET’s operating at 77 and 300 K 102
Three dimensional distribution of Latchup current in scaled CMOS structures 97
Measurement of the Hot Hole Injection Probability from Si Into SiO2 in p-MOSFET’s 95
Short channel and hot carrier performance of ULSI MOSFETs with halo structures 93
Quantitative Assesment of mobility degradation by Remote Coulomb Scattering in Ultra-thin oxide MOSFETs: measurement and simulations 91
On the Optimization of HALOs for 0.1 micron MOSFETs and Below 89
Modeling of Mobility in Ultra-Thin SOI MOSFETs: Physical Understanding and Analytical Models for Device Simulators 84
Two-dimensional quantum mechanical aspects in the charge distribution of ULSI silicon MOSFETs 80
Microelectronic Engineering Special Issue devoted to the 2001 Insulating Films on Semiconductors Conference, INFOS 2001 79
Monte Carlo simulation of program and erase charge distribution in NROM devices 75
Optimization Guidelines for Epitaxial Collectors of Advanced BJT’s with Improved Breakdown Voltage and Speed 74
Investigation of Hot Electron Luminescence in Silicon by means of Dual Gate MOS Structures 69
Totale 7.277
Categoria #
all - tutte 24.232
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 24.232


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021139 0 0 0 0 0 0 0 0 0 26 89 24
2021/2022455 16 43 30 26 7 18 45 14 6 75 102 73
2022/2023479 62 50 16 62 56 124 0 25 64 2 7 11
2023/2024204 21 11 1 2 9 114 0 2 15 5 4 20
2024/20251.043 15 60 75 16 14 32 50 51 103 134 156 337
2025/20261.523 77 170 229 231 256 130 163 62 82 123 0 0
Totale 7.277