IRIS
SANGIORGI, Enrico
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 4.436
AS - Asia 1.636
EU - Europa 1.065
SA - Sud America 354
AF - Africa 46
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 1
Totale 7.543
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 4.384
SG - Singapore 813
UA - Ucraina 342
BR - Brasile 289
CN - Cina 272
DE - Germania 235
HK - Hong Kong 162
VN - Vietnam 157
FI - Finlandia 120
RU - Federazione Russa 96
FR - Francia 66
TR - Turchia 56
SE - Svezia 55
IE - Irlanda 50
IN - India 39
IT - Italia 37
CA - Canada 34
GB - Regno Unito 28
KR - Corea 28
BD - Bangladesh 24
AR - Argentina 22
EC - Ecuador 18
ZA - Sudafrica 15
ID - Indonesia 14
IQ - Iraq 13
MX - Messico 13
MA - Marocco 10
PK - Pakistan 8
NL - Olanda 7
PY - Paraguay 7
CL - Cile 6
DZ - Algeria 5
JO - Giordania 5
PL - Polonia 5
AT - Austria 4
BE - Belgio 4
CO - Colombia 4
JP - Giappone 4
PH - Filippine 4
TW - Taiwan 4
AE - Emirati Arabi Uniti 3
EG - Egitto 3
ES - Italia 3
EU - Europa 3
KE - Kenya 3
MY - Malesia 3
PS - Palestinian Territory 3
TH - Thailandia 3
TN - Tunisia 3
UZ - Uzbekistan 3
VE - Venezuela 3
AL - Albania 2
BO - Bolivia 2
CZ - Repubblica Ceca 2
ET - Etiopia 2
GR - Grecia 2
HU - Ungheria 2
IR - Iran 2
KG - Kirghizistan 2
KZ - Kazakistan 2
NP - Nepal 2
OM - Oman 2
PA - Panama 2
SA - Arabia Saudita 2
UY - Uruguay 2
XK - ???statistics.table.value.countryCode.XK??? 2
AU - Australia 1
AZ - Azerbaigian 1
BN - Brunei Darussalam 1
CH - Svizzera 1
CY - Cipro 1
DO - Repubblica Dominicana 1
IL - Israele 1
KH - Cambogia 1
KW - Kuwait 1
MD - Moldavia 1
MG - Madagascar 1
NI - Nicaragua 1
NO - Norvegia 1
PT - Portogallo 1
RS - Serbia 1
SD - Sudan 1
SR - Suriname 1
TG - Togo 1
TT - Trinidad e Tobago 1
TZ - Tanzania 1
ZW - Zimbabwe 1
Totale 7.543
Salva come PNG Salva come JPEG
Città #
Woodbridge 597
Ann Arbor 493
Fairfield 405
Singapore 265
Houston 255
Jacksonville 252
Ashburn 243
Chandler 243
Wilmington 176
Cambridge 171
Seattle 170
Hong Kong 160
Beijing 138
Dearborn 122
New York 116
San Jose 107
Boardman 69
Ho Chi Minh City 57
Princeton 57
Lauterbourg 54
The Dalles 52
Dublin 50
Izmir 48
Los Angeles 47
Buffalo 38
Council Bluffs 37
Hanoi 35
Hefei 28
Seoul 27
Dallas 25
Grafing 25
São Paulo 24
San Diego 21
San Mateo 21
Santa Clara 18
Ottawa 17
Des Moines 13
Norwalk 13
Düsseldorf 10
Ogden 10
Quito 9
Udine 9
Atlanta 8
Belo Horizonte 8
Helsinki 8
Mumbai 8
Orem 8
Brasília 7
Denver 7
Haiphong 7
Johannesburg 7
Redondo Beach 7
Chicago 6
Kunming 6
Moscow 6
Rio de Janeiro 6
San Francisco 6
Amman 5
Baghdad 5
Chennai 5
Curitiba 5
Da Nang 5
Frankfurt am Main 5
Hải Dương 5
Montreal 5
Nanjing 5
Phoenix 5
Porto Alegre 5
Shanghai 5
Warsaw 5
Washington 5
Anápolis 4
Asunción 4
Brooklyn 4
Casablanca 4
Caxias do Sul 4
Dhaka 4
Hangzhou 4
Munich 4
New Delhi 4
Poplar 4
Rome 4
Salvador 4
Tokyo 4
Agadir 3
Brussels 3
Bến Cầu 3
Cuiabá 3
Divinópolis 3
Fayetteville 3
Fortaleza 3
Jacareí 3
Lahore 3
London 3
Maceió 3
Mauá 3
Nairobi 3
New Taipei 3
Palaiseau 3
Quận Bình Thạnh 3
Totale 5.002
Salva come PNG Salva come JPEG
Nome #
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors 218
An Experimental Study of Low Field Electron Mobility in Double-Gate, Ultra-Thin SOI MOSFETs 205
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 199
A Study of Injection Conditions in the Substrate Hot Electron Induced Degradation of n-MOSFETs 182
Layout dependence of CMOS Latch-up 179
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 178
A Comparative Study of Hot-Carrier Induced Light Emission and Degradation in Bulk and SOI MOSFETs 174
A combined transport-injection model for hot-electron and hot-hole injection in the gate oxide of MOS structures 171
Analysis of Uniform Degradation in n-MOSFETs 168
A novel method to determine the Source and Drain resistances of individual MOSFETs 167
Monitoring Hot Carrier Degradation in SOI MOSFETs by Hot Carrier Luminescence Techniques 165
Latch-up in CMOS circuits: a review 165
Bias and Temperature Dependence of Homogeneous Hot-Electron Injection from Silicon into Silicon Dioxide at Low Voltages 160
Hot-Electron induced Photon Energies in n-channel MOSFET’s operating at 77 and 300 K 159
An Improved Test Structure to Characterize Ultra- Low Hot Carrier Injection in Homogeneous Conditions 157
Impact Ionization and Photon Emission in MOS Capacitors and FETs 157
Parameter extraction from I-V characteristics of single MOSFETs 155
Monte-Carlo simulation of MOSFETs with band offsets in the source and drain 155
Bias and Temperature Dependence of Gate and Substrate Currents in n-MOSFETs at Low Drain Voltage 150
Hysteresis cycle in the Latch-up characteristic of wide CMOS structures 149
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors 148
Physically Based modeling of Low Field Electron Mobility in Ultrathin Single- and Double-Gate SOI n-MOSFETs 147
Device simulation for decananometer MOSFETs 147
Energy Dependent Electron and Hole Impact Ionization in Si Bipolar Transistors 145
Photon Emission from sub-micron p-channel MOSFETs Biased at High Fields 138
Characterization and Modeling of Hot-Carrier Luminescence in Silicon n+/n/n+ Devices 135
Evidence of Substrate Enhanced High Energy Tails in the Distribution Function of Deep Submicron MOSFETs by Light Emission Measurements 135
Non-Local Effects in p-MOSFET Substrate Hot Hole Injection Experiments 134
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs 134
A better insight in the performance of silicon bjt's featuring highly non-uniform collector doping profiles 130
Analysis of highly non-uniform collector doping profiles for the optimization of the breakdown / speed trade off in advanced BJTs 129
Two dimensional quantum simulation of silicon MOSFETs 128
Oxide Field Dependence of Electron Injection From Silicon into Silicon Dioxide 128
Two-dimensional quantum mechanical simulation of charge distribution in silicon MOSFETs 127
Injection Efficiency of CHISEL Gate Currents in Short MOS Devices: Physical Mechanisms, Device Implications and Sensitivity to Technological Parameters", 124
Experimental Analysis of Polarization in the Hot-Carrier Luminescence of Silicon Devices 123
Non Local Electron and Hole Impact Ionization in Advanced Si BJTs 122
Substrate Enhanced Gate Currents in CMOS Devices 117
Monte Carlo Simulation of Low Voltage Hot Carrier Effects in Non Volatile Memory Cells 117
Coupled Monte Carlo Simulation of Si and SiO2 Transport in MOS Capacitors 116
Measurements of Low Field Mobility in Ultra Thin SOI n- and p-MOSFETs 114
Low Field Mobility of Ultra Thin SOI n- and p-MOSFETs: Measurement and Implications on the Performance of Ultra Short MOSFETs 112
Electron Injection in the Gate Oxide of MOS Structures at Liquid Nitrogen Temperature: Measurement and Simulation 108
Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs 107
A Test Chip and an Accurate Measurement System to Characterize Hot Hole Injection in the Gate Oxide of p-MOSFET’s 106
Three dimensional distribution of Latchup current in scaled CMOS structures 103
Measurement of the Hot Hole Injection Probability from Si Into SiO2 in p-MOSFET’s 100
Short channel and hot carrier performance of ULSI MOSFETs with halo structures 96
On the Optimization of HALOs for 0.1 micron MOSFETs and Below 96
Quantitative Assesment of mobility degradation by Remote Coulomb Scattering in Ultra-thin oxide MOSFETs: measurement and simulations 94
Modeling of Mobility in Ultra-Thin SOI MOSFETs: Physical Understanding and Analytical Models for Device Simulators 86
Two-dimensional quantum mechanical aspects in the charge distribution of ULSI silicon MOSFETs 82
Microelectronic Engineering Special Issue devoted to the 2001 Insulating Films on Semiconductors Conference, INFOS 2001 80
Monte Carlo simulation of program and erase charge distribution in NROM devices 79
Optimization Guidelines for Epitaxial Collectors of Advanced BJT’s with Improved Breakdown Voltage and Speed 77
Investigation of Hot Electron Luminescence in Silicon by means of Dual Gate MOS Structures 73
Totale 7.550
Salva come PNG Salva come JPEG
Categoria #
all - tutte 26.064
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 26.064
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022455 16 43 30 26 7 18 45 14 6 75 102 73
2022/2023479 62 50 16 62 56 124 0 25 64 2 7 11
2023/2024204 21 11 1 2 9 114 0 2 15 5 4 20
2024/20251.043 15 60 75 16 14 32 50 51 103 134 156 337
2025/20261.699 77 170 229 231 256 130 163 62 82 145 113 41
2026/202797 97 0 0 0 0 0 0 0 0 0 0 0
Totale 7.550