IRIS
SANGIORGI, Enrico
 Distribuzione geografica
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Continente #
NA - Nord America 3.832
EU - Europa 944
AS - Asia 511
SA - Sud America 81
AF - Africa 11
Continente sconosciuto - Info sul continente non disponibili 4
Totale 5.383
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Nazione #
US - Stati Uniti d'America 3.812
UA - Ucraina 334
SG - Singapore 288
DE - Germania 228
FI - Finlandia 116
CN - Cina 108
RU - Federazione Russa 89
BR - Brasile 71
SE - Svezia 55
TR - Turchia 51
IE - Irlanda 49
KR - Corea 28
IT - Italia 26
CA - Canada 18
GB - Regno Unito 16
FR - Francia 14
IN - India 11
NL - Olanda 4
TW - Taiwan 4
ZA - Sudafrica 4
AR - Argentina 3
EG - Egitto 3
EU - Europa 3
HK - Hong Kong 3
JO - Giordania 3
BE - Belgio 2
BO - Bolivia 2
CZ - Repubblica Ceca 2
EC - Ecuador 2
GR - Grecia 2
IQ - Iraq 2
IR - Iran 2
KG - Kirghizistan 2
MA - Marocco 2
MX - Messico 2
PL - Polonia 2
AE - Emirati Arabi Uniti 1
AT - Austria 1
BD - Bangladesh 1
BN - Brunei Darussalam 1
CH - Svizzera 1
CL - Cile 1
CO - Colombia 1
CY - Cipro 1
ES - Italia 1
HU - Ungheria 1
JP - Giappone 1
KE - Kenya 1
KH - Cambogia 1
KZ - Kazakistan 1
NO - Norvegia 1
TG - Togo 1
UY - Uruguay 1
UZ - Uzbekistan 1
VN - Vietnam 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 5.383
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Città #
Woodbridge 597
Ann Arbor 493
Fairfield 405
Houston 254
Jacksonville 251
Chandler 243
Ashburn 189
Wilmington 176
Cambridge 171
Seattle 166
Singapore 150
Dearborn 122
New York 107
Boardman 68
Beijing 57
Princeton 56
Dublin 49
Izmir 48
Seoul 27
Grafing 25
San Diego 21
San Mateo 21
Ottawa 17
Des Moines 13
Norwalk 13
Düsseldorf 10
Ogden 10
Udine 9
Belo Horizonte 6
Kunming 6
Lauterbourg 6
Los Angeles 6
Santa Clara 6
Hefei 5
Nanjing 5
Shanghai 5
Hangzhou 4
Helsinki 4
São Paulo 4
Amman 3
Brasília 3
Frankfurt am Main 3
Hong Kong 3
Johannesburg 3
Moscow 3
New Taipei 3
Palaiseau 3
Rome 3
Simi Valley 3
Amsterdam 2
Athens 2
Augusta 2
Baotou 2
Bishkek 2
Bologna 2
Brno 2
Brussels 2
Cairo 2
Chennai 2
Chicago 2
Fortaleza 2
Hebei 2
Ipatinga 2
La Paz 2
Leawood 2
Nanchang 2
New Delhi 2
Portsmouth 2
Shenyang 2
Torre Del Greco 2
Warsaw 2
Americana 1
Andover 1
Ardabil 1
Atibaia 1
Auburn Hills 1
Bandar Seri Begawan 1
Bexley 1
Birigui 1
Bismarck 1
Bogotá 1
Bom Princípio 1
Buenos Aires 1
Cachoeiro de Itapemirim 1
Canoas 1
Caratinga 1
Casablanca 1
Castanhal 1
Changsha 1
Charleston 1
Charlotte 1
Chengdu 1
Cidade Gaúcha 1
Collarmele 1
Conselheiro Lafaiete 1
Contagem 1
Cuiabá 1
Curitiba 1
Dallas 1
Dois Vizinhos 1
Totale 3.928
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Nome #
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors 167
An Experimental Study of Low Field Electron Mobility in Double-Gate, Ultra-Thin SOI MOSFETs 166
A Study of Injection Conditions in the Substrate Hot Electron Induced Degradation of n-MOSFETs 156
Layout dependence of CMOS Latch-up 149
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 148
Monitoring Hot Carrier Degradation in SOI MOSFETs by Hot Carrier Luminescence Techniques 139
Effects of the interaction of neighboring structures on the Latch-up behavior of C-MOS ICs 132
An Improved Test Structure to Characterize Ultra- Low Hot Carrier Injection in Homogeneous Conditions 131
A Comparative Study of Hot-Carrier Induced Light Emission and Degradation in Bulk and SOI MOSFETs 128
Hysteresis cycle in the Latch-up characteristic of wide CMOS structures 128
A novel method to determine the Source and Drain resistances of individual MOSFETs 127
Analysis of Uniform Degradation in n-MOSFETs 126
Latch-up in CMOS circuits: a review 126
A combined transport-injection model for hot-electron and hot-hole injection in the gate oxide of MOS structures 124
Monte-Carlo simulation of MOSFETs with band offsets in the source and drain 119
Bias and Temperature Dependence of Homogeneous Hot-Electron Injection from Silicon into Silicon Dioxide at Low Voltages 117
Parameter extraction from I-V characteristics of single MOSFETs 114
Non-Local Effects in p-MOSFET Substrate Hot Hole Injection Experiments 113
Evidence of Substrate Enhanced High Energy Tails in the Distribution Function of Deep Submicron MOSFETs by Light Emission Measurements 112
Energy Dependent Electron and Hole Impact Ionization in Si Bipolar Transistors 111
Impact Ionization and Photon Emission in MOS Capacitors and FETs 109
Photon Emission from sub-micron p-channel MOSFETs Biased at High Fields 104
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors 103
Injection Efficiency of CHISEL Gate Currents in Short MOS Devices: Physical Mechanisms, Device Implications and Sensitivity to Technological Parameters", 100
Bias and Temperature Dependence of Gate and Substrate Currents in n-MOSFETs at Low Drain Voltage 99
Oxide Field Dependence of Electron Injection From Silicon into Silicon Dioxide 99
Two dimensional quantum simulation of silicon MOSFETs 98
Device simulation for decananometer MOSFETs 98
Physically Based modeling of Low Field Electron Mobility in Ultrathin Single- and Double-Gate SOI n-MOSFETs 97
Analysis of highly non-uniform collector doping profiles for the optimization of the breakdown / speed trade off in advanced BJTs 90
A better insight in the performance of silicon bjt's featuring highly non-uniform collector doping profiles 87
Study of low field electron transport in ultra-thin single and double gate SOI MOSFETs 87
Non Local Electron and Hole Impact Ionization in Advanced Si BJTs 86
Electron Injection in the Gate Oxide of MOS Structures at Liquid Nitrogen Temperature: Measurement and Simulation 86
Substrate Enhanced Gate Currents in CMOS Devices 83
Two-dimensional quantum mechanical simulation of charge distribution in silicon MOSFETs 83
Monte Carlo Simulation of Low Voltage Hot Carrier Effects in Non Volatile Memory Cells 80
Experimental Analysis of Polarization in the Hot-Carrier Luminescence of Silicon Devices 79
Characterization and Modeling of Hot-Carrier Luminescence in Silicon n+/n/n+ Devices 79
Measurements of Low Field Mobility in Ultra Thin SOI n- and p-MOSFETs 79
Three dimensional distribution of Latchup current in scaled CMOS structures 76
Hot-Electron induced Photon Energies in n-channel MOSFET’s operating at 77 and 300 K 75
Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs 71
A Test Chip and an Accurate Measurement System to Characterize Hot Hole Injection in the Gate Oxide of p-MOSFET’s 69
Coupled Monte Carlo Simulation of Si and SiO2 Transport in MOS Capacitors 67
Low Field Mobility of Ultra Thin SOI n- and p-MOSFETs: Measurement and Implications on the Performance of Ultra Short MOSFETs 67
Modeling of Mobility in Ultra-Thin SOI MOSFETs: Physical Understanding and Analytical Models for Device Simulators 61
Measurement of the Hot Hole Injection Probability from Si Into SiO2 in p-MOSFET’s 60
Quantitative Assesment of mobility degradation by Remote Coulomb Scattering in Ultra-thin oxide MOSFETs: measurement and simulations 58
Microelectronic Engineering Special Issue devoted to the 2001 Insulating Films on Semiconductors Conference, INFOS 2001 57
Investigation of Hot Electron Luminescence in Silicon by means of Dual Gate MOS Structures 55
Short channel and hot carrier performance of ULSI MOSFETs with halo structures 50
Two-dimensional quantum mechanical aspects in the charge distribution of ULSI silicon MOSFETs 44
On the Optimization of HALOs for 0.1 micron MOSFETs and Below 43
Optimization Guidelines for Epitaxial Collectors of Advanced BJT’s with Improved Breakdown Voltage and Speed 42
Monte Carlo simulation of program and erase charge distribution in NROM devices 36
Totale 5.390
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Categoria #
all - tutte 18.482
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 18.482
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020103 0 0 0 0 0 0 0 0 0 0 20 83
2020/2021696 19 70 10 80 41 114 32 72 119 26 89 24
2021/2022455 16 43 30 26 7 18 45 14 6 75 102 73
2022/2023479 62 50 16 62 56 124 0 25 64 2 7 11
2023/2024204 21 11 1 2 9 114 0 2 15 5 4 20
2024/2025679 15 60 75 16 14 32 50 51 103 134 129 0
Totale 5.390