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Effect of the Grid Size on the Stability of Self-Consistent Monte-Carlo Simulations
2005-01-01 N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna
Electron transport in 2D crystal semiconductors and their device applications
2015-01-01 Jena, Debdeep; Li, Mingda; Ma, Nan; Hwang, Wan Sik; Esseni, David; Seabaugh, Alan; Xing, Huili Grace
Enhanced Ballisticity in nano-MOSFETs along the ITRS Roadmap: A Monte Carlo Study
2004-01-01 S., Eminente; Esseni, David; Palestri, Pierpaolo; C., Fiegna; Selmi, Luca; E., Sangiorgi
Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs
2009-01-01 Serra, N; Conzatti, F; Esseni, David; DE MICHIELIS, M; Palestri, Pierpaolo; Selmi, Luca; Thomas, S; Whall, T. E.; Parker, E. H. C.; Leadley, D. R.; Witters, L; Hikavyy, A; Hytch, M. J.; Houdellier, F; Snoeck, E; Wang, T. J.; Lee, W. C.; Vellianitis, G; VAN DAL, M. J. H.; Duriez, B; Doornbos, G; Lander, R. J. P.
Experimental and Simulation Study of the Biaxial Strain and Temperature dependence of the Electron Mobility Enhancement in Si MOSFETs
2007-01-01 Driussi, Francesco; Esseni, David; Selmi, Luca; P. E., Hellstrom; G., Malm; J., Hallstedt; M., Ostling; T. J., Grasby; D. R., Leadley; X., Mescot
Experimental Evidence and Statistical Modeling of Cooperating Defects in Stressed Oxides
2004-01-01 Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J.; Widdershoven, F.
Experimental Extraction of Charge Centroid and of Charge Type in the P/E operation of SONOS Memory Cells
2006-01-01 Arreghini, Antonio; Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J.; VAN SCHAIJK, R.
Experimental procedure for accurate trap density study by low frequency charge pumping measurements
2011-01-01 Datta, A; Driussi, Francesco; Esseni, David; Molas, G; Nowak, E.
Experimental Signature and Physical Mechanisms of Substrate Enhanced Gate Current in MOS Devices
1998-01-01 Esseni, David; Selmi, Luca
Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides
2001-01-01 Esseni, David; Bude, J; Selmi, Luca
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Effect of the Grid Size on the Stability of Self-Consistent Monte-Carlo Simulations | 1-gen-2005 | N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna | |
Electron transport in 2D crystal semiconductors and their device applications | 1-gen-2015 | Jena, Debdeep; Li, Mingda; Ma, Nan; Hwang, Wan Sik; Esseni, David; Seabaugh, Alan; Xing, Huili Grace | |
Enhanced Ballisticity in nano-MOSFETs along the ITRS Roadmap: A Monte Carlo Study | 1-gen-2004 | S., Eminente; Esseni, David; Palestri, Pierpaolo; C., Fiegna; Selmi, Luca; E., Sangiorgi | |
Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs | 1-gen-2009 | Serra, N; Conzatti, F; Esseni, David; DE MICHIELIS, M; Palestri, Pierpaolo; Selmi, Luca; Thomas, S; Whall, T. E.; Parker, E. H. C.; Leadley, D. R.; Witters, L; Hikavyy, A; Hytch, M. J.; Houdellier, F; Snoeck, E; Wang, T. J.; Lee, W. C.; Vellianitis, G; VAN DAL, M. J. H.; Duriez, B; Doornbos, G; Lander, R. J. P. | |
Experimental and Simulation Study of the Biaxial Strain and Temperature dependence of the Electron Mobility Enhancement in Si MOSFETs | 1-gen-2007 | Driussi, Francesco; Esseni, David; Selmi, Luca; P. E., Hellstrom; G., Malm; J., Hallstedt; M., Ostling; T. J., Grasby; D. R., Leadley; X., Mescot | |
Experimental Evidence and Statistical Modeling of Cooperating Defects in Stressed Oxides | 1-gen-2004 | Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J.; Widdershoven, F. | |
Experimental Extraction of Charge Centroid and of Charge Type in the P/E operation of SONOS Memory Cells | 1-gen-2006 | Arreghini, Antonio; Driussi, Francesco; Esseni, David; Selmi, Luca; VAN DUUREN, M. J.; VAN SCHAIJK, R. | |
Experimental procedure for accurate trap density study by low frequency charge pumping measurements | 1-gen-2011 | Datta, A; Driussi, Francesco; Esseni, David; Molas, G; Nowak, E. | |
Experimental Signature and Physical Mechanisms of Substrate Enhanced Gate Current in MOS Devices | 1-gen-1998 | Esseni, David; Selmi, Luca | |
Experimental Study of Low Voltage Anode Hole Injection in Thin Oxides | 1-gen-2001 | Esseni, David; Bude, J; Selmi, Luca |
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Opzioni
Scopri
Tipologia
- 4 Contributo in Atti di Convegno ... 160
- 4 Contributo in Atti di Convegno ... 160
Data di pubblicazione
- 2020 - 2024 17
- 2010 - 2019 72
- 2000 - 2009 64
- 1994 - 1999 7
Editore
- IEEE 30
- Institute of Electrical and Elect... 15
- Editions Frontieres 2
- Association for Computing Machinery 1
- DIEGM - Università degli Studi di... 1
- Springer Wien New York 1
Rivista
- ECS TRANSACTIONS 1
- MICROELECTRONIC ENGINEERING 1
- PROCEEDINGS OF THE EUROPEAN SOLID... 1
- SOLID-STATE ELECTRONICS 1
Serie
- INTERNATIONAL CONFERENCE ON SIMUL... 2
- PROCEEDINGS OF THE EUROPEAN SOLID... 2
- TECHNICAL DIGEST - INTERNATIONAL ... 2
Keyword
- Electrical and Electronic Enginee... 5
- FinFETs 4
- Electronic 3
- Field effect transistors 3
- Integrated circuit modeling 3
- Logic gates 3
- NEGF 3
- Neuromorphic Computing 3
- Optical and Magnetic Materials 3
- Scattering 3
Lingua
- eng 119
Accesso al fulltext
- reserved 96
- no fulltext 50
- partially open 7
- restricted 5
- open 2