Compact expression to model the effects of dielectric absorption on analog-to-digital converters

An analytical model for the dielectric absorption on capacitors and its impact on the errors induced in ADC conversion is here proposed. The reported simulations are consistent with the results of the R-C model widely used in the literature and well reproduce a large set of capacitance versus frequency and current versus time experiments. We also measured ADC conversion errors due to the dielectric absorption and we demonstrated that such errors can be reproduced by our model just calibrating one single technology parameter.