Sfoglia per Autore
Energy Dependent Electron and Hole Impact Ionization in Si Bipolar Transistors
1998-01-01 Palestri, Pierpaolo; Selmi, Luca; Hurkx, F; Slotboom, J; Sangiorgi, Enrico
Optimization Guidelines for Epitaxial Collectors of Advanced BJT’s with Improved Breakdown Voltage and Speed
1998-01-01 Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Hurkx, F; Slotboom, J; Sangiorgi, Enrico
Analysis of highly non-uniform collector doping profiles for the optimization of the breakdown / speed trade off in advanced BJTs
1999-01-01 Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Peter, M. S.; Hurkx, G. A. M.; Slotboom, J. W.; Sangiorgi, Enrico
Coupled Monte Carlo Simulation of Si and SiO2 Transport in MOS Capacitors
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; M., Pavesi; F., Widdershoven; Sangiorgi, Enrico
Non Local Electron and Hole Impact Ionization in Advanced Si BJTs
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; Hurkx, G. A. M.; Slotboom, J. W.; Terpstra, D; Peter, M; Woltjer, R; Sangiorgi, Enrico
Hot Carrier Effects in MOS capacitors: Improvements in Coupled Monte Carlo Simulations of Si and SiO2 Transport
2000-01-01 P., Rigolli; M., Manfredi; M., Pavesi; Palestri, Pierpaolo; Selmi, Luca
A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations
2000-01-01 DALLA SERRA, Alberto; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven
Tunnelling Injection in Thin Oxide MOS Capacitors
2000-01-01 . DALLA SERRA, A.; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, E.
Impact Ionization and Photon Emission in MOS Capacitors and FETs
2000-01-01 Palestri, Pierpaolo; M., Pavesi; P., Rigolli; Selmi, Luca; DALLA SERRA, Alberto; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico
Monte Carlo Analysis of Signal Delays in BJTs
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, E.
A better insight in the performance of silicon bjt's featuring highly non-uniform collector doping profiles
2000-01-01 Palestri, Pierpaolo; Fiegna, C.; Selmi, Luca; Peter, M. S.; Hurkx, G. A. M.; Slotboom, J. W.; Sangiorgi, Enrico
A Monte Carlo Technique to Investigate Signal Delays of Advanced Si BJT's up to High Currents
2000-01-01 Palestri, Pierpaolo; Selmi, Luca; G. A. M., Hurkx; J. W., Slotboom
Device simulation for advenced Si(1-x) Ge(x) HBTs
2001-01-01 M., Mastrapasqua; A., Pacelli; Palestri, Pierpaolo; C. A., King
Monte Carlo Simulation of Impact Ionization in SiGe HBTs
2001-01-01 Palestri, Pierpaolo; Pacelli, A.; Mastrapasqua, M.; Bude, J. D.
Non-local microscopic view of signal propagation times in BJTs biased up to high currents
2001-01-01 Palestri, Pierpaolo; Selmi, Luca
Closed- and Open- boundary Models for Gate-Current calculation in n-MOSFETs
2001-01-01 DALLA SERRA, Alberto; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca; Widdershoven, F.
On the Extraction of Oxide Thickness and Sub-Band Energy Shift in Thin Oxide MOS Capacitors with Permeable Gates
2001-01-01 DALLA SERRA, Alberto; Palestri, Pierpaolo; Selmi, Luca; Widdershoven, F.
Microscopic Analysis of the Impact of Substrate Bias on the Gate Current of pMOSFETs
2001-01-01 Zanchetta, Sergio; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Thermal Resistance in Si(1-x) Ge(x) HBTs on Bulk and SOI Substrates
2001-01-01 Palestri, Pierpaolo; A., Pacelli; M., Mastrapasqua
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors
2002-01-01 Palestri, Pierpaolo; DALLA SERRA, Alberto; Selmi, Luca; M., Pavesi; Rigolli, P. L.; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico
Investigation on convergence and stability of self-consistent Monte Carlo device simulations
2002-01-01 Clerc, R; Palestri, Pierpaolo; Abramo, Antonio
Phase Noise Modelling in Phase Locked Loop Frequency Synthesizer
2002-01-01 Nonis, Roberto; Palestri, Pierpaolo; DA DALT, N; Selmi, Luca
Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs
2002-01-01 Palestri, Pierpaolo; Selmi, Luca; DALLA SERRA, Alberto; Abramo, Antonio; Sangiorgi, Enrico; M., Pavesi; P., Rigolli; F., Widdershoven
Spontaneous hot carrier photon emission rates in silicon: improved modeling and application to metal oxide semiconductor devices
2002-01-01 Pavesi, M; Rigolli, Pl; Manfredi, M; Palestri, Pierpaolo; Selmi, Luca
A Drift-Diffusion/Monte Carlo Simulation Methodology for SiGe HBT Design
2002-01-01 Palestri, Pierpaolo; Mastrapasqua, M.; Pacelli, A.; King, C. A.
Compact Modeling of Thermal Resistance in Bipolar Transistors on Bulk and SOI substrates
2002-01-01 Pacelli, A.; Palestri, Pierpaolo; Mastrapasqua, M.
Physics-Based and Compact Models for Self-Heating in High-Speed Bipolar Integrated Circuits
2002-01-01 A., Pacelli; Palestri, Pierpaolo; M., Mastrapasqua
Can photon emission/absorption processes explain the substrate current of tunneling MOS capacitors ?
2002-01-01 DALLA SERRA, Alberto; Palestri, Pierpaolo; Selmi, Luca
Minimizing thermal resistance and collector-to-substrate capacitance in graded base SiGe BiCMOS on SOI
2002-01-01 M., Mastrapasqua; Palestri, Pierpaolo; A., Pacelli; G. K., Celler; M. R., Frei; P. R., Smith; R. W., Johnson; L., Bizzarro; W., Lin; T. G., Ivanov; M. S., Carroll; I. C., Kizilyalli; C. A., King
Towards Microscopic Understanding of MOSFET Reliability: the Role of Carrier Energy and Transport Simulations
2003-01-01 Selmi, Luca; Esseni, David; Palestri, Pierpaolo
A Methodology to Extract the Channel Current of Permeable Gate Oxide MOSFETs
2003-01-01 Palestri, Pierpaolo; Esseni, David; Selmi, Luca; Guegan, G.; Sangiorgi, E.
Carrier Quantization in SOI MOSFETs using an Effective Potential Based Monte-Carlo Tool
2003-01-01 Palestri, Pierpaolo; Esseni, David; Abramo, Antonio; Clerc, R; Selmi, Luca
Device simulation for decananometer MOSFETs
2003-01-01 Sangiorgi, Enrico; Palestri, Pierpaolo; Esseni, David; Fiegna, C.; Abramo, Antonio; Selmi, Luca
Enhanced Ballisticity in nano-MOSFETs along the ITRS Roadmap: A Monte Carlo Study
2004-01-01 S., Eminente; Esseni, David; Palestri, Pierpaolo; C., Fiegna; Selmi, Luca; E., Sangiorgi
A Monte Carlo Study of the Role of Scattering in Deca-nanometer MOSFETs
2004-01-01 Palestri, Pierpaolo; Esseni, David; S., Eminente; C., Fiegna; E., Sangiorgi; Selmi, Luca
Full Band and Approximated Solutions of the Schr\"odinger Equation in Silicon Inversion Layers
2004-01-01 Esseni, David; Palestri, Pierpaolo
Monte-Carlo Simulations of Hot-carrier Effects and Photon-Emission in MOS Devices
2004-01-01 Palestri, Pierpaolo
An improved semiclassical Monte-Carlo approach for nano-scale MOSFET simulation
2004-01-01 Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Sangiorgi, E; Selmi, Luca
Modeling, Design and Characterization of a new low Jitter Analog Dual Tuning LC-VCO PLL Architecture
2004-01-01 Nonis, Roberto; DA DALT, N; Palestri, Pierpaolo; Selmi, Luca
On the extraction of the channel current in permeable gate oxide MOSFETs
2004-01-01 Palestri, P; Esseni, D; Guegan, G
Comparative Analysis of Basic Transport Properties in the Inversion Layer of Bulk and SOI MOSFETs: a Monte-Carlo Study
2004-01-01 Lucci, Luca; Esseni, David; Palestri, Pierpaolo; Selmi, Luca
Effect of the Grid Size on the Stability of Self-Consistent Monte-Carlo Simulations
2005-01-01 N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna
A Model to Understand Current Consumption, Maximum Operating Frequency And Scaling Trends Of MCML Frequency Dividers
2005-01-01 Nonis, Roberto; Palumbo, Enzo; Palestri, Pierpaolo; Selmi, Luca
Full-Band Quantization Analysis Reveals a Third Valley in Silicon Inversion Layers
2005-01-01 Esseni, David; Palestri, Pierpaolo
Modeling, design and characterization of a new Low Jitter analog Dual Tuning LC-VCO PLL Architecture
2005-01-01 Nonis, Roberto; DA DALT, N; Palestri, Pierpaolo; Selmi, Luca
Multi-subband Monte Carlo modeling of nano-MOSFETs with strong vertical quantization and electron gas degeneration
2005-01-01 Lucci, Luca; Palestri, Pierpaolo; Esseni, David; Selmi, Luca
Stability of Self-Consistent Monte-Carlo Simulations: Revised Analysis of Linear and Non-Linear Poisson Schemes
2005-01-01 N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna
Monte-Carlo Analysis of Ballistic Transport in MOSFETs along the ITRS Roadmap
2005-01-01 Palestri, Pierpaolo; S., Eminente; Esseni, David; C., Fiegna; Selmi, Luca; E., Sangiorgi
Ballistic Effects in Advanced MOSFETs along the Roadmap
2005-01-01 Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Energy Dependent Electron and Hole Impact Ionization in Si Bipolar Transistors | 1-gen-1998 | Palestri, Pierpaolo; Selmi, Luca; Hurkx, F; Slotboom, J; Sangiorgi, Enrico | |
Optimization Guidelines for Epitaxial Collectors of Advanced BJT’s with Improved Breakdown Voltage and Speed | 1-gen-1998 | Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Hurkx, F; Slotboom, J; Sangiorgi, Enrico | |
Analysis of highly non-uniform collector doping profiles for the optimization of the breakdown / speed trade off in advanced BJTs | 1-gen-1999 | Palestri, Pierpaolo; Fiegna, C; Selmi, Luca; Peter, M. S.; Hurkx, G. A. M.; Slotboom, J. W.; Sangiorgi, Enrico | |
Coupled Monte Carlo Simulation of Si and SiO2 Transport in MOS Capacitors | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; M., Pavesi; F., Widdershoven; Sangiorgi, Enrico | |
Non Local Electron and Hole Impact Ionization in Advanced Si BJTs | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; Hurkx, G. A. M.; Slotboom, J. W.; Terpstra, D; Peter, M; Woltjer, R; Sangiorgi, Enrico | |
Hot Carrier Effects in MOS capacitors: Improvements in Coupled Monte Carlo Simulations of Si and SiO2 Transport | 1-gen-2000 | P., Rigolli; M., Manfredi; M., Pavesi; Palestri, Pierpaolo; Selmi, Luca | |
A comparison between semi-classical and quantum-mechanical escape-times for gate current calculations | 1-gen-2000 | DALLA SERRA, Alberto; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca | |
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, Enrico; M., Pavesi; F., Widdershoven | |
Tunnelling Injection in Thin Oxide MOS Capacitors | 1-gen-2000 | . DALLA SERRA, A.; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, E. | |
Impact Ionization and Photon Emission in MOS Capacitors and FETs | 1-gen-2000 | Palestri, Pierpaolo; M., Pavesi; P., Rigolli; Selmi, Luca; DALLA SERRA, Alberto; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico | |
Monte Carlo Analysis of Signal Delays in BJTs | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; Sangiorgi, E. | |
A better insight in the performance of silicon bjt's featuring highly non-uniform collector doping profiles | 1-gen-2000 | Palestri, Pierpaolo; Fiegna, C.; Selmi, Luca; Peter, M. S.; Hurkx, G. A. M.; Slotboom, J. W.; Sangiorgi, Enrico | |
A Monte Carlo Technique to Investigate Signal Delays of Advanced Si BJT's up to High Currents | 1-gen-2000 | Palestri, Pierpaolo; Selmi, Luca; G. A. M., Hurkx; J. W., Slotboom | |
Device simulation for advenced Si(1-x) Ge(x) HBTs | 1-gen-2001 | M., Mastrapasqua; A., Pacelli; Palestri, Pierpaolo; C. A., King | |
Monte Carlo Simulation of Impact Ionization in SiGe HBTs | 1-gen-2001 | Palestri, Pierpaolo; Pacelli, A.; Mastrapasqua, M.; Bude, J. D. | |
Non-local microscopic view of signal propagation times in BJTs biased up to high currents | 1-gen-2001 | Palestri, Pierpaolo; Selmi, Luca | |
Closed- and Open- boundary Models for Gate-Current calculation in n-MOSFETs | 1-gen-2001 | DALLA SERRA, Alberto; Abramo, Antonio; Palestri, Pierpaolo; Selmi, Luca; Widdershoven, F. | |
On the Extraction of Oxide Thickness and Sub-Band Energy Shift in Thin Oxide MOS Capacitors with Permeable Gates | 1-gen-2001 | DALLA SERRA, Alberto; Palestri, Pierpaolo; Selmi, Luca; Widdershoven, F. | |
Microscopic Analysis of the Impact of Substrate Bias on the Gate Current of pMOSFETs | 1-gen-2001 | Zanchetta, Sergio; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Thermal Resistance in Si(1-x) Ge(x) HBTs on Bulk and SOI Substrates | 1-gen-2001 | Palestri, Pierpaolo; A., Pacelli; M., Mastrapasqua | |
A Comparative Analysis of Substrate Current Generation Mechanisms in Tunneling MOS Capacitors | 1-gen-2002 | Palestri, Pierpaolo; DALLA SERRA, Alberto; Selmi, Luca; M., Pavesi; Rigolli, P. L.; Abramo, Antonio; F., Widdershoven; Sangiorgi, Enrico | |
Investigation on convergence and stability of self-consistent Monte Carlo device simulations | 1-gen-2002 | Clerc, R; Palestri, Pierpaolo; Abramo, Antonio | |
Phase Noise Modelling in Phase Locked Loop Frequency Synthesizer | 1-gen-2002 | Nonis, Roberto; Palestri, Pierpaolo; DA DALT, N; Selmi, Luca | |
Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs | 1-gen-2002 | Palestri, Pierpaolo; Selmi, Luca; DALLA SERRA, Alberto; Abramo, Antonio; Sangiorgi, Enrico; M., Pavesi; P., Rigolli; F., Widdershoven | |
Spontaneous hot carrier photon emission rates in silicon: improved modeling and application to metal oxide semiconductor devices | 1-gen-2002 | Pavesi, M; Rigolli, Pl; Manfredi, M; Palestri, Pierpaolo; Selmi, Luca | |
A Drift-Diffusion/Monte Carlo Simulation Methodology for SiGe HBT Design | 1-gen-2002 | Palestri, Pierpaolo; Mastrapasqua, M.; Pacelli, A.; King, C. A. | |
Compact Modeling of Thermal Resistance in Bipolar Transistors on Bulk and SOI substrates | 1-gen-2002 | Pacelli, A.; Palestri, Pierpaolo; Mastrapasqua, M. | |
Physics-Based and Compact Models for Self-Heating in High-Speed Bipolar Integrated Circuits | 1-gen-2002 | A., Pacelli; Palestri, Pierpaolo; M., Mastrapasqua | |
Can photon emission/absorption processes explain the substrate current of tunneling MOS capacitors ? | 1-gen-2002 | DALLA SERRA, Alberto; Palestri, Pierpaolo; Selmi, Luca | |
Minimizing thermal resistance and collector-to-substrate capacitance in graded base SiGe BiCMOS on SOI | 1-gen-2002 | M., Mastrapasqua; Palestri, Pierpaolo; A., Pacelli; G. K., Celler; M. R., Frei; P. R., Smith; R. W., Johnson; L., Bizzarro; W., Lin; T. G., Ivanov; M. S., Carroll; I. C., Kizilyalli; C. A., King | |
Towards Microscopic Understanding of MOSFET Reliability: the Role of Carrier Energy and Transport Simulations | 1-gen-2003 | Selmi, Luca; Esseni, David; Palestri, Pierpaolo | |
A Methodology to Extract the Channel Current of Permeable Gate Oxide MOSFETs | 1-gen-2003 | Palestri, Pierpaolo; Esseni, David; Selmi, Luca; Guegan, G.; Sangiorgi, E. | |
Carrier Quantization in SOI MOSFETs using an Effective Potential Based Monte-Carlo Tool | 1-gen-2003 | Palestri, Pierpaolo; Esseni, David; Abramo, Antonio; Clerc, R; Selmi, Luca | |
Device simulation for decananometer MOSFETs | 1-gen-2003 | Sangiorgi, Enrico; Palestri, Pierpaolo; Esseni, David; Fiegna, C.; Abramo, Antonio; Selmi, Luca | |
Enhanced Ballisticity in nano-MOSFETs along the ITRS Roadmap: A Monte Carlo Study | 1-gen-2004 | S., Eminente; Esseni, David; Palestri, Pierpaolo; C., Fiegna; Selmi, Luca; E., Sangiorgi | |
A Monte Carlo Study of the Role of Scattering in Deca-nanometer MOSFETs | 1-gen-2004 | Palestri, Pierpaolo; Esseni, David; S., Eminente; C., Fiegna; E., Sangiorgi; Selmi, Luca | |
Full Band and Approximated Solutions of the Schr\"odinger Equation in Silicon Inversion Layers | 1-gen-2004 | Esseni, David; Palestri, Pierpaolo | |
Monte-Carlo Simulations of Hot-carrier Effects and Photon-Emission in MOS Devices | 1-gen-2004 | Palestri, Pierpaolo | |
An improved semiclassical Monte-Carlo approach for nano-scale MOSFET simulation | 1-gen-2004 | Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Sangiorgi, E; Selmi, Luca | |
Modeling, Design and Characterization of a new low Jitter Analog Dual Tuning LC-VCO PLL Architecture | 1-gen-2004 | Nonis, Roberto; DA DALT, N; Palestri, Pierpaolo; Selmi, Luca | |
On the extraction of the channel current in permeable gate oxide MOSFETs | 1-gen-2004 | Palestri, P; Esseni, D; Guegan, G | |
Comparative Analysis of Basic Transport Properties in the Inversion Layer of Bulk and SOI MOSFETs: a Monte-Carlo Study | 1-gen-2004 | Lucci, Luca; Esseni, David; Palestri, Pierpaolo; Selmi, Luca | |
Effect of the Grid Size on the Stability of Self-Consistent Monte-Carlo Simulations | 1-gen-2005 | N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna | |
A Model to Understand Current Consumption, Maximum Operating Frequency And Scaling Trends Of MCML Frequency Dividers | 1-gen-2005 | Nonis, Roberto; Palumbo, Enzo; Palestri, Pierpaolo; Selmi, Luca | |
Full-Band Quantization Analysis Reveals a Third Valley in Silicon Inversion Layers | 1-gen-2005 | Esseni, David; Palestri, Pierpaolo | |
Modeling, design and characterization of a new Low Jitter analog Dual Tuning LC-VCO PLL Architecture | 1-gen-2005 | Nonis, Roberto; DA DALT, N; Palestri, Pierpaolo; Selmi, Luca | |
Multi-subband Monte Carlo modeling of nano-MOSFETs with strong vertical quantization and electron gas degeneration | 1-gen-2005 | Lucci, Luca; Palestri, Pierpaolo; Esseni, David; Selmi, Luca | |
Stability of Self-Consistent Monte-Carlo Simulations: Revised Analysis of Linear and Non-Linear Poisson Schemes | 1-gen-2005 | N., Barin; Palestri, Pierpaolo; Esseni, David; C., Fiegna | |
Monte-Carlo Analysis of Ballistic Transport in MOSFETs along the ITRS Roadmap | 1-gen-2005 | Palestri, Pierpaolo; S., Eminente; Esseni, David; C., Fiegna; Selmi, Luca; E., Sangiorgi | |
Ballistic Effects in Advanced MOSFETs along the Roadmap | 1-gen-2005 | Sangiorgi, E; Palestri, Pierpaolo; Eminente, S; Esseni, David; Fiegna, C; Selmi, Luca |
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